Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies

Applied Physics Letters

Volumn 81, Issue 4, 2002, Pages 754-756

  Kalinin, Sergei V ^a   Bonnell, Dawn A ^a   Freitag, Marcus ^b   Johnson, A T ^b  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTRAST TRANSFER; EXPERIMENTAL OBSERVATION; GEOMETRIC PROPERTIES; NANOELECTRONIC DEVICES; POTENTIAL DISTRIBUTIONS; QUANTITATIVE KNOWLEDGE; SCANNING SURFACE POTENTIAL MICROSCOPIES; TIP CALIBRATION;

CARBON NANOTUBES; ELECTRIC PROPERTIES; ELECTROSTATICS; NANOELECTRONICS; SCANNING;

ELECTROSTATIC DEVICES;

EID: 79955984766     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1496129     Document Type: Article

References (25)

1. S. V. Kalinin and D. A. Bonnell, in Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, edited by D. A. Bonnell (Wiley, New York, 2000), p. 205, and references therein.
2. Z. Y. Li, B. Y. Gu, and G. Z. Yang, Phys. Rev. B 57, 9225 (1998). prb PRBMDO 0163-1829
3. S. Lanyi, J. Torok, and P. Rehurek, J. Vac. Sci. Technol. B 14, 892 (1996). jvb JVTBD9 0734-211X
4. A. Efimov and S. R. Cohen, J. Vac. Sci. Technol. A 18, 1051 (2000). jva JVTAD6 0734-2101
5. S. Belaidi, P. Girard, and G. Leveque, J. Appl. Phys. 81, 1023 (1997). jap JAPIAU 0021-8979
6. L. Olsson, N. Lin, V. Yakimov, and R. Erlandsson, J. Appl. Phys. 84, 4060 (1998). jap JAPIAU 0021-8979
7. H. O. Jacobs, H. F. Knapp, and A. Stemmer, Rev. Sci. Instrum. 70, 1756 (1999). rsi RSINAK 0034-6748
8. F. Robin, H. Jacobs, O. Homan, A. Stemmer, and W. Bächtold, Appl. Phys. Lett. 76, 2907 (2000). apl APPLAB 0003-6951
9. H. O. Jacobs, P. Leuchtmann, O. J. Homan, and A. Stemmer, J. Appl. Phys. 84, 1168 (1998). jap JAPIAU 0021-8979
10. H. Sugimura, Y. Ishida, K. Hayashi, O. Takai, and N. Nakagiri, Appl. Phys. Lett. 80, 1459 (2002). apl APPLAB 0003-6951
11. H. J. Dai, J. H. Hafner, A. G. Rinzler, D. T. Colbert, and R. E. Smalley, Nature (London) 384, 147 (1996). nat NATUAS 0028-0836
12. S. Takahashi, T. Kishida, S. Akita, and Y. Nakayama, Jpn. J. Appl. Phys., Part 1 40, 4314 (2001). jjb JAPNDE 0021-4922
13. S. B. Arnason, A. G. Rinzler, Q. Hudspeth, and A. F. Hebard, Appl. Phys. Lett. 75, 2842 (1999). apl APPLAB 0003-6951
14. N. Choi, T. Uchihashi, H. Nishijima, T. Ishida, W. Mizutani, S. Akita, Y. Nakayama, M. Ishikawa, and H. Tokumoto, Jpn. J. Appl. Phys., Part 1 39, 3707 (2000). jjb JAPNDE 0021-4922
15. A. Bachtold, M. S. Fuhrer, S. Plyasunov, M. Forero, E. H. Anderson, A. Zettl, and P. L. McEuen, Phys. Rev. Lett. 84, 6082 (2000). prl PRLTAO 0031-9007
16. S. V. Kalinin and D. A. Bonnell, Appl. Phys. Lett. 78, 1306 (2001). apl APPLAB 0003-6951
17. J. H. Hafner, C. L. Cheung, and C. M. Lieber, J. Am. Chem. Soc. 121, 9750 (1999). acs JACSAT 0002-7863
18. M. Freitag, M. Radosavljevic, Y. Zhou, A. T. Johnson, and W. F. Smith, Appl. Phys. Lett. 79, 3326 (2001). apl APPLAB 0003-6951
19. A. K. Henning, T. Hochwitz, J. Slinkman, J. Never, S. Hoffmann, P. Kaszuba, and C. Daghlian, J. Appl. Phys. 77, 1888 (1995). jap JAPIAU 0021-8979
20. S. V. Kalinin and D. A. Bonnell, Phys. Rev. B 63, 125411 (2001). prb PRBMDO 0163-1829
21. G. Koley, M. G. Spencer, and H. R. Bhangale, Appl. Phys. Lett. 79, 545 (2001). apl APPLAB 0003-6951
22. S. V. Kalinin and D. A. Bonnell (unpublished).
23. This result is valid for SPM techniques based on force detection. The resolution in force-gradient based techniques such as EFM is better because it is defined by the second derivative of tip-surface capacitance.
24. S. V. Kalinin and D. A. Bonnell, Phys. Rev. B 62, 10419 (2000). prb PRBMDO 0163-1829
25. M. Freitag and A. T. Johnson (unpublished).