Band excitation in scanning probe microscopy: Sines of change

Journal of Physics D: Applied Physics

Volumn 44, Issue 46, 2011, Pages

  Jesse, Stephen ^a   Kalinin, Sergei V ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISSIPATIVE INTERACTION; ELECTRICAL AND MECHANICAL PROPERTIES; ELECTRICAL MEASUREMENT; FUNDAMENTAL PHYSICS; NANO-SCALE MATERIALS; NANOMETRES; NANOSCALE SCIENCE; RELIABLE STUDIES; SINGLE-FREQUENCY; SINUSOIDAL EXCITATIONS; SPM METHOD;

ELECTRIC PROPERTIES; MECHANICAL PROPERTIES; NANOMAGNETICS; NANOSTRUCTURED MATERIALS; PROBES;

SCANNING PROBE MICROSCOPY;

EID: 80755181331     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/46/464006     Document Type: Article

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