Feed-forward compensation of surface potential in atomic force microscopy

Review of Scientific Instruments

Volumn 79, Issue 6, 2008, Pages

  Ziegler, Dominik ^a   Naujoks, Nicola ^a,b   Stemmer, Andreas ^a  

^a ETH ZURICH   (Switzerland)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROMAGNETIC INDUCTION; ELECTROMAGNETISM; ENGINEERING GEOLOGY; ERRORS; INDUCTANCE; MAGNETISM; MICROSCOPIC EXAMINATION; OPTIMAL CONTROL SYSTEMS; SCANNING PROBE MICROSCOPY; SURFACE CHARGE; SURFACE PROPERTIES; SURFACE TOPOGRAPHY; TOPOGRAPHY;

(1 1 0) SURFACE; AMERICAN INSTITUTE OF PHYSICS (AIP); ATOMIC FORCE (AF); ELECTRET FILMS; FEED FORWARD (FF); FEED-FORWARD COMPENSATION; KELVIN PROBE (KP); KELVIN PROBE FORCE MICROSCOPY (KPFM); LOCAL WORK; SCAN LINE; SIGNIFICANT REDUCTION; SURFACE CHARGING; TAPPING MODE (TM); TIP-INDUCED;

SURFACE POTENTIAL;

EID: 46449123484     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2947740     Document Type: Article

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