Nonlinear transport imaging by scanning impedance microscopy

Applied Physics Letters

Volumn 85, Issue 18, 2004, Pages 4240-4242

  Shin, J ^a,b   Meunier, V ^a   Baddorf, A P ^a   Kalinin, S V ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF TENNESSEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROACTIVE INTERFACE; POTENTIAL DISTRIBUTIONS; SCANNING IMPEDANCE MICROSCOPY (SIM); SCANNING PROBE MICROSCOPY (SPM);

CANTILEVER BEAMS; FREQUENCY MODULATION; HARMONIC ANALYSIS; MATHEMATICAL MODELS; OPTICAL MICROSCOPY; SCANNING; SIGNAL PROCESSING; SIGNAL TO NOISE RATIO;

IMAGING TECHNIQUES;

EID: 10044277085     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1812372     Document Type: Article

References (11)

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