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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 4 A, 2005, Pages 1633-1636

Local surface potential measurements of carbon nanotube FETs by Kelvin probe force microscopy

(4) Miyato, Yuji a Kobayashi, Kei a Matsushige, Kazumi a Yamada, Hirofumi a

a KYOTO UNIVERSITY (Japan)

Author keywords

Dielectrophoresis; Kelvin probe force microscopy; Schottky barrier; Single wall carbon nanotube; Surface potential

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRODES; ELECTROPHORESIS; FIELD EFFECT TRANSISTORS; FREQUENCY MODULATION; INTERFACES (MATERIALS); NATURAL FREQUENCIES;

DIELECTROPHORESIS; KELVIN PROBE FORCE MICROSCOPY; SCHOTTKY BARRIER; SINGLE WALL CARBON NANOTUBE; SURFACE POTENTIAL;

CARBON NANOTUBES;

EID: 21244448009 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/JJAP.44.1633 Document Type: Article

Times cited : (33)

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