Note: On the deconvolution of Kelvin probe force microscopy data

Review of Scientific Instruments

Volumn 81, Issue 5, 2010, Pages

  Blumel A ^a,b   Plank, H ^a   Klug, A ^a,b   Fisslthaler, E ^a   Sezen, M ^a   Grogger, W ^a   List, E J W ^a,b  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL DATA; KELVIN PROBE FORCE MICROSCOPY; SIMPLE GEOMETRIES; SIMULATED IMAGES; SURFACE POTENTIAL DISTRIBUTIONS;

ATOMIC FORCE MICROSCOPY; CONVOLUTION; NANOCANTILEVERS; PROBES; SURFACE PROPERTIES;

SURFACE POTENTIAL;

EID: 77952962585     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3428735     Document Type: Article

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