Submicrosecond time resolution atomic force microscopy for probing nanoscale dynamics

Nano Letters

Volumn 12, Issue 2, 2012, Pages 893-898

  Giridharagopal, Rajiv ^a   Rayermann, Glennis E ^a   Shao, Guozheng ^a   Moore, David T ^a   Reid, Obadiah G ^a   Tillack, Andreas F ^a   Masiello, David J ^a   Ginger, David S ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

bulk heterojunction; electrostatic force microscopy; organic solar cells; P3HT:PCBM; Scanning probe microscopy

Indexed keywords

BULK HETEROJUNCTION; ELECTROSTATIC FORCE MICROSCOPY; ORGANIC SOLAR CELL; P3HT:PCBM; SCANNING PROBES;

DYNAMICS; HETEROJUNCTIONS; NANOTECHNOLOGY;

ATOMIC FORCE MICROSCOPY;

NANOMATERIAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; PARTICLE SIZE; THERMODYNAMICS; TIME;

MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; PARTICLE SIZE; THERMODYNAMICS; TIME FACTORS;

EID: 84856970536     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl203956q     Document Type: Article

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