Resolution theory, and static and frequency-dependent cross-talk in piezoresponse force microscopy

Nanotechnology

Volumn 21, Issue 40, 2010, Pages

  Jesse, S ^a   Guo, S ^a   Kumar, A ^a   Rodriguez, B J ^b   Proksch, R ^c   Kalinin, S V ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY COLLEGE DUBLIN   (Ireland)

^c United States   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXCITATION METHODS; FREQUENCY-DEPENDENT; IN-BAND; LINEAR RESOLUTIONS; MULTIVARIATE STATISTICAL ANALYSIS; NON-IDEALITIES; PIEZORESPONSE FORCE MICROSCOPY; RESOLUTION THEORY; TARGET SIGNALS;

MULTIVARIANT ANALYSIS; SCANNING PROBE MICROSCOPY;

CROSSTALK;

EID: 77958559743     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/40/405703     Document Type: Article

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