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Volumn 43, Issue 4, 2010, Pages 541-550

Nanoscale quantitative measurement of the potential of charged nanostructures by electrostatic and Kelvin probe force microscopy: Unraveling electronic processes in complex materials

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EID: 77951231779     PISSN: 00014842     EISSN: 15204898     Source Type: Journal    
DOI: 10.1021/ar900247p     Document Type: Article
Times cited : (168)

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