ac driving amplitude dependent systematic error in scanning Kelvin probe microscope measurements: Detection and correction

Review of Scientific Instruments

Volumn 77, Issue 4, 2006, Pages

  Wu, Yan ^a   Shannon, Mark A ^a  

^a United States of America   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT POTENTIAL DIFFERENCE (CPD); LINEAR REGRESSION; SCANNING KELVIN PROBE MICROSCOPE (SKPM);

ERROR ANALYSIS; FEEDBACK CONTROL; REGRESSION ANALYSIS; SEMICONDUCTOR MATERIALS; SIGNAL DETECTION;

MICROSCOPES;

EID: 33646402066     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2195104     Document Type: Article

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