Potential shielding by the surface water layer in Kelvin probe force microscopy

Applied Physics Letters

Volumn 80, Issue 8, 2002, Pages 1459-1461

  Sugimura, Hiroyuki ^a   Ishida, Yuzuru ^a   Hayashi, Kazuyuki ^a   Takai, Osamu ^a   Nakagiri, Nobuyuki ^b  

^a NAGOYA UNIVERSITY   (Japan)

^b NIKON CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORBED WATER; ADSORBED WATER LAYERS; DRY NITROGEN; KELVIN PROBE FORCE MICROSCOPY; OXIDE LAYER; OXIDE SURFACE; SHIELDING EFFECT; SURFACE HYDROXYL GROUPS; SURFACE WATER LAYER; THERMAL-ANNEALING; WATER CONTACT ANGLE;

CONTACT ANGLE; HYDROPHILICITY; HYDROPHOBICITY; PROBES; SHIELDING;

TWO DIMENSIONAL;

EID: 79956014509     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1455145     Document Type: Article

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