Negative Bias Temperature Instabilities in pMOSFET Devices

Reliability Wearout Mechanisms in Advanced CMOS Technologies

Volumn , Issue , 2009, Pages 331-439

  LaRosa, Giuseppe ^a  

^a IEEE   (United States)

Author keywords

NBTI (a pMOSFET wearout mechanism) and NBTI stress bias configuration; NBTI damage and NBTI modeling in correct end of life extrapolation; Negative bias temperature instabilities (NBTI) in pMOSFET devices

Indexed keywords

EID: 84855922022     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9780470455265.ch4     Document Type: Chapter

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