Ballistic phonon enhanced NBTI

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2007, Pages 258-263

  Wang, Y ^a   Cheung, K P ^a   Qates, A ^b   Mason, P ^c  

^a RUTGERS UNIVERSITY   (United States)

^b TSMC Ltd

^c AGERE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; HEAT LOSSES; HEAT PROBLEMS; PHONON SCATTERING; RELIABILITY ANALYSIS; THERMAL ENERGY; THERMODYNAMIC STABILITY;

BALLISTIC PHONON EFFECT; CHANNEL LENGTHS; DRAIN JUNCTION;

MOSFET DEVICES;

EID: 34548746935     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2007.369902     Document Type: Conference Paper

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