|
|
|
Volumn , Issue , 2000, Pages 205-209
|
|
Bias-Temperature degradation of pMOSFETs: Mechanism and suppression
a
a
NEC CORPORATION
(Japan)
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
DIELECTRIC FILMS;
ELECTRIC CURRENTS;
ELECTRIC FIELD EFFECTS;
ELECTRODES;
ELECTRON TUNNELING;
GATES (TRANSISTOR);
IMPACT IONIZATION;
SEMICONDUCTING SILICON;
SILICA;
CARRIER SEPARATION;
TUNNELING ELECTRON CURRENTS;
MOSFET DEVICES;
|
|
EID: 0033750707
PISSN: 00999512
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
|
Times cited : (40)
|
|
References (5)
|
