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Volumn 57, Issue 16, 1998, Pages 10030-10034
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Electrical activity of interfacial paramagnetic defects in thermal (100)
a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000119442
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.57.10030 Document Type: Article |
Times cited : (121)
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References (24)
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