Degradation dynamics, recovery, and characterization of negative bias temperature instability

Microelectronics Reliability

Volumn 45, Issue 1, 2005, Pages 99-105

  Ershov, M ^a   Saxena, S ^a   Minehane, S ^a   Clifton, P ^a   Redford, M ^a   Lindley, R ^a   Karbasi, H ^a   Graves, S ^a   Winters, S ^a  

^a PDF SOLUTIONS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; ENERGY DISSIPATION; MATHEMATICAL MODELS; OPTIMIZATION; PROBLEM SOLVING; RELIABILITY; STRESS ANALYSIS; VOLTAGE MEASUREMENT;

BIAS TEMPERATURE; FIELD RELIABILITY; PRODUCT RELIABILITY; TEMPERATURE INSTABILITY;

MOSFET DEVICES;

EID: 10044271788     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.03.020     Document Type: Article

References (14)

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