AC NBTI studied in the 1 Hz - 2 GHz range on dedicated on-chip CMOS circuits

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2006, Pages

  Fernandez R ^b,c,d   Kaczer, B ^a   Nackaerts, A ^a   Demuynck, S ^a   Rodriguez R ^c   Nafria M ^c   Groeseneken, G ^a  

^a IMEC   (Belgium)

^b Universitat Autònoma de Barcelona ^*

^c UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

^d GENERALITAT DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS CIRCUITS; CMOS INVERTERS; MULTIPLE MODES; ON CHIPS; ON-CHIP CIRCUITS; ON-THE-FLY; SINGLE WAFERS; STRESS TIME; WIDE FREQUENCY RANGE;

ELECTRON DEVICES; NEGATIVE TEMPERATURE COEFFICIENT; OPTICAL DESIGN;

THERMODYNAMIC STABILITY;

EID: 46049120673     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2006.346777     Document Type: Conference Paper

References (13)

1. V. Reddy et al., Proc. IRPS, p. 248 (2002).
2. G. Chen et al. Proc. IRPS, p. 196 (2003).
3. S. Chakravarthi et al., Proc. IRPS, p. 273 (2004).
4. M. A. Alam, IEDM Tech. Digest, p. 345 (2003).
5. W. Abadeer and W. Ellis, Proc. IRPS, p. 17 (2003).
6. B. Zhu et al., Proc IRW, p. 125 (2002).
7. K.O. Jeppson et al., JAP, p. 2004 Vol 48 (1977).
8. T. Nigam and E. B. Harris, Proc. IRPS, p. 289 (2006).
9. B. Kaczer et al., IEDM Tech. Digest, p. 553 (2000).
10. M. Denais et al., IEDM Tech. Digest, p. 109 (2004).
11. V. Huard et al., Microelectron. Reliab., p. 1 (2006).
12. H.-H. Ji et al., IEDM Tech. Digest, p. 721 (2005).
13. G. T. Sasse and J. Schmitz, Proc. IRPS, p. 627 (2006).