SCOPUS 정보 검색 플랫폼

Volumn 7, Issue 7, 2011, Pages 930-938

μ-EXAFS, μ-XRF, and μ-PL characterization of a multi-quantum-well electroabsorption modulated laser realized via selective area growth

(11) Mino, Lorenzo a Gianolio, Diego a Agostini, Giovanni a Piovano, Andrea a Truccato, Marco a Agostino, Angelo a Cagliero, Stefano a Martinez Criado, Gema b D'Acapito, Francesco c Codato, Simone d Lamberti, Carlo a

a UNIVERSITY OF TURIN (Italy)

b EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

c IOM CNR LABORATORIO TASC (Italy)

d BROADCOM CORPORATION (United States)

Author keywords

EXAFS; electroabsorption modulated lasers; multi quantum well devices; selective area growth; synchrotron radiation

Indexed keywords

BEAM LINES; CHEMICAL COMPOSITIONS; CHIP-LEVEL; ELECTRO-ABSORPTION MODULATED LASER; ELECTROABSORPTION MODULATED LASERS; EXAFS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; HETEROSTRUCTURES; MICRO BEAMS; MICROMETER-SCALE; MONOLITHIC INTEGRATION; MONOLITHICALLY INTEGRATED; MULTI-QUANTUM-WELL DEVICES; MULTIPLE QUANTUM WELLS; MULTIQUANTUM WELLS; OPTICAL-FIBER COMMUNICATION; QUATERNARY ALLOYS; SELECTIVE AREA GROWTH; SELECTIVE AREA GROWTH TECHNIQUES; SPATIAL VARIATIONS; STATE OF THE ART; SYNCHROTRON RADIATION SOURCE; SYNCHROTRON X-RAY MICROBEAM; TECHNICAL IMPROVEMENT; THIRD GENERATION; X RAY FLUORESCENCE; X-RAY SOURCES;

ELECTROABSORPTION MODULATORS; ELECTROOPTICAL DEVICES; EQUIPMENT; INTEGRATION; LIGHT TRANSMISSION; MICROMETERS; MODULATION; MONOLITHIC INTEGRATED CIRCUITS; OPTICAL LINKS; OPTOELECTRONIC DEVICES; QUANTUM OPTICS; SEMICONDUCTOR QUANTUM WELLS; SYNCHROTRON RADIATION; SYNCHROTRONS; THICKNESS MEASUREMENT; X RAY DIFFRACTION; X RAYS;

QUANTUM WELL LASERS;

QUANTUM DOT;

ARTICLE; FLUORESCENCE; LASER; LUMINESCENCE; METHODOLOGY; SPECTROFLUOROMETRY; SYNCHROTRON; X RAY ABSORPTION SPECTROSCOPY; X RAY DIFFRACTION;

FLUORESCENCE; LASERS; LUMINESCENCE; LUMINESCENT MEASUREMENTS; QUANTUM DOTS; SPECTROMETRY, FLUORESCENCE; SYNCHROTRONS; X-RAY ABSORPTION SPECTROSCOPY; X-RAY DIFFRACTION;

EID: 79953757271 PISSN: 16136810 EISSN: 16136829 Source Type: Journal
DOI: 10.1002/smll.201001229 Document Type: Article

Times cited : (21)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.