Strain and composition determination in semiconducting heterostructures by high-resolution X-ray diffraction

Characterization of Semiconductor Heterostructures and Nanostructures

Volumn , Issue , 2008, Pages 93-132

  Ferrari, Claudio ^a   Bocchi, Claudio ^a  

^a IMEM CNR   (Italy)

Author keywords

composition; composition graded heterostructures; measurement; strain measurement; strain release models; X ray characterization of heterostructures; X ray characterization of quantum dot heterostructures

Indexed keywords

EID: 84882862239     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-0-444-53099-8.00004-X     Document Type: Chapter

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