Nearest-neighbor distances in strained thin films of random pseudobinary semiconductor alloys: A calculational methodology

Journal of Applied Physics

Volumn 96, Issue 1, 2004, Pages 369-373

  D'Acapito, F ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY ALLOYS; CHEMICAL BONDS; CRYSTAL LATTICES; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELASTICITY; FILM GROWTH; MATHEMATICAL MODELS; SEMICONDUCTING FILMS; X RAY ANALYSIS;

BOND LENGTHS; BOND STRETCHING; ELASTIC ENERGY; VALENCE FORCE FIELD METHOD;

THIN FILMS;

EID: 3142784356     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1760236     Document Type: Article

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