Synchrotron X-ray microdiffraction diagnostics of multilayer optoelectronic devices

Applied Physics Letters

Volumn 75, Issue 1, 1999, Pages 100-102

  Cai, Z H ^a   Rodrigues, W ^a   Ilinski, P ^a   Legnini, D ^a   Lai, B ^a   Yun, W ^a   Isaacs, E D ^b   Lutterodt, K E ^b   Grenko, J ^b   Glew, R ^b   Sputz, S ^b   Vandenberg, J ^b   People, R ^b   Alam, M A ^b   Hybertsen, M ^b   Ketelsen, L J P ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MULTILAYERS; NONDESTRUCTIVE EXAMINATION; PROBES; VAPOR PHASE EPITAXY;

SYNCHROTRON X-RAY MICRODIFFRACTION DIAGNOSTICS;

OPTOELECTRONIC DEVICES;

EID: 0032621680     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124288     Document Type: Article

References (7)

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