Local, submicron, strain gradients as the cause of Sn whisker growth

Applied Physics Letters

Volumn 94, Issue 22, 2009, Pages

  Sobiech, M ^a,b   Wohlschlogel M ^a   Welzel, U ^a   Mittemeijer, E J ^a   Hugel W ^b   Seekamp, A ^b   Liu, W ^c   Ice, G E ^d  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b ROBERT BOSCH GMBH   (Germany)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPTH GRADIENT; DRIVING FORCES; IN-PLANE; LAUE DIFFRACTION; OUT-OF-PLANE; RESIDUAL STRAINS; SN WHISKER; STRAIN DISTRIBUTIONS; STRAIN GRADIENTS; SUBMICRON; WHISKER GROWTH; WHITE BEAMS;

CRYSTAL WHISKERS;

TIN;

EID: 66749102617     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3147864     Document Type: Article

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