Lattice distortion in In(x) Ga(1−x) As/InP epitaxial films: A second-and third-shell XAFS study

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 11, 2001, Pages

  Tormen, M ^a,f   De Salvador, D ^a   Drigo, A V ^a   Romanato, F ^b   Boscherini, F ^c   Mobilio, S ^d,e  

^a INFM   (Italy)

^b LABORATORIO TASC   (Italy)

^c UNIVERSITY OF BOLOGNA   (Italy)

^d INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

^e ROMA TRE UNIVERSITY   (Italy)

^f UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC; GALLIUM; INDIUM; PHOSPHORUS;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL STRUCTURE; FILM; MEASUREMENT; OSCILLATION; PHYSICS; POLARIZATION; STRUCTURE ANALYSIS; X RAY ANALYSIS;

EID: 0034907129     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.115326     Document Type: Article

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