Microbeam-Forming Methods for Synchrotron Radiation

X-Ray Spectrometry

Volumn 26, Issue 6, 1997, Pages 315-326

  Ice, G E ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SOURCES; SYNCHROTRONS; X RAY APPARATUS;

FRESNEL ZONE PLATE; HARD X RAY; HARD X RAYS; KIRKPATRICK-BAEZ MIRROR; MICRO BEAMS; MICRO-PROBES; SUBMICRON; SYNCHROTRON X-RAYS; X-RAY BEAM; X-RAY SOURCES;

SYNCHROTRON RADIATION;

EID: 0031479703     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1097-4539(199711/12)26:6<315::aid-xrs229>3.0.co;2-n     Document Type: Article

References (48)

1. D. H. Bilderback, B. M. Lairson, T. W. Barbee, Jr, G. E. Ice and C. J. Sparks, Nucl. Instrum. Methods 208, 251 (1983).
2. M. R. Howells and J. B. Hastings, Nucl. Instrum. Methods 208, 379 (1983).
3. G. E. Ice and C. J. Sparks, Nucl. Instrum. Methods 222, 121 (1984).
4. C. J. Sparks and G. E. Ice, Mater. Res. Soc. Symp. Proc. 143, 223 (1989).
5. A. C. Thompson, K. L. Chapman, G. E. Ice, C. J. Sparks, W. Yun, B. Lai, D. Legnini, P. J. Vicarro, M. L. Rivers, D. H. Bilderback and D. J. Thiel, Nucl. Instrum. Methods. Sect. A 319, 320 (1992).
6. K. W. Jones and B. M. Gordon, Anal Chem. 61, 341 (1989).
7. J. H. Underwood, A. C. Thompson, J. B. Kortright, K. C. Chapman and D. Lunt, Rev. Sci. Instrum. 67, 1 (1996).
8. B. X. Yang, Rev. Sci. Instrum. 66, 2278 (1995).
9. M. R. Howells and D. Lunt, Opt. Eng. 32, 1981 (1993).
10. W. B. Yun, B. Lai, D. Legnini, Y. H. Xiao, J. Chrzas, K. M. Skulina, R. M. Bionta, V. White and F. Cerrina, SPIE 1740, 117 (1992).
11. R. M. Bionta, E. Ables, O. Clamp, O. D. Edwards, P. C. Gabriele, K. Miller, L. L. Ott, K. M. Skulina, R. Tilley and T. Viada, Opt. Eng. 29, 576 (1990).
12. A. A. Snigirev, I. I. Snigireava, C. Riekel, A. Miller, L. Wess and T. Wess, J. Phys. (Paris) IV, 3, Suppl. JPIII, N12, 403 (1993).
13. J. Chavanne, P. Elleaume, E. Tarazona, Y. M. Hartman, I. I. Snigireva an A. A. Snigirev, Rev. Sci. Instrum. 65, 1959 (1994).
14. E. A. Stern, Z. Kalman, A. Lewis and K. Lieberman, Appl. Opt. 27, 5135 (1988).
15. S. Larsson and P. Engström, Adv. X-Ray Anal. 35, 1019 (1992).
16. D. H. Bilderbach, S. A. Hoffman and D. J. Thiel, Science 263, 201 (1994).
17. C. J. Sparks, in Synchrotron Radiation Research, edited by H. Winick and S. Doniach, p. 459. Plenum Press, New York (1980).
18. R. Rebonato, G. E. Ice, A. Habenschuss and J. C. Bilello, Philos. Mag. A 60, 57 (1989).
19. N. Yamamoto and S. Sakata Jpn J. Appl. Phys. 34, 664 (1995).
20. P. Horowitz and J. A. Howell, Science 178, 608 (1972).
21. C. J. Sparks, Jr, and J. B. Hastings, Oak Ridge National Laboratory Report, ORNL-5089. Oak Ridge National Laboratory, Oak Ridge, TN (1975).
22. C. J. Sparks, Jr, S. Raman, H. L. Yakel, R. V. Gentry and M. O. Krause, Phys. Rev. Lett. 38, 208 (1977).
23. C. J. Sparks, Jr, S. Raman, H. L. Yakel, R. V. Gentry and M. O. Krause, Phys. Rev. Lett. 40, 507 (1978).
24. R. V. Gentry, T. A. Cahill, N. R. Fletcher, H. C. Kaufmann, L. R. Medsker, J. W. Nelson and R. G. Flocchini, Phys. Rev. Lett. 37, 11 (1976).
25. A. Franks, Sci. Prog. (Oxford) 64, 371-422 (1977).
26. E. D. Johnson, S. L. Hulbert and L. E. Berman, 'Beamlines at synchrotron radiation facilities: the link between users and the machine', AIP Conf. Proc. 249, 859 (1992).
27. M. Rivers, S. R. Sutton and B. M. Gordon, Mater. Res. Symp. Proc. 143, 285 (1989).
28. C. Riekel, J. Phys. (Paris) IV, C8, 403 (1993); C. Riekel, P. Bosecke and M. Sanchez del Rio, Rev. Sci. Instrum. 63, 974 (1992).
29. C. Riekel, J. Phys. (Paris) IV, C8, 403 (1993); C. Riekel, P. Bosecke and M. Sanchez del Rio, Rev. Sci. Instrum. 63, 974 (1992).
30. S. A. Hoffman, D. J. Thiel and D. H. Bilderback, Opt. Eng. 33, 303 (1994).
31. D. J. Thiel, E. A. Stern, D. H. Bilderback and A. Lewis, Physica B 158, 314 (1989).
32. D. L. Brewe, S. M. Heald, B. Barg, F. C. Brown, K. H. Kim and E. A. Stern, SPIE Proc. to be published.
33. G. S. Cargill, III, K. Hwang, J. W. Lam, P. C. Wang, E. Liniger and I. C. Noyan, SPIE 2516 (1995).
34. N. Yamamoto and Y. Hosokawa, Jpn. J. Appl. Phys. 27, L2203 (1988).
35. P. Engstrom, S. Larsson, A. Rindby, A. Buttkewitz, S. Garbe, G. Gaul, A. Knochel and F. Lechtenberg, Nucl. Instrum, Methods, Sect. A 302, 547 (1991).
36. A. K. Freund, F. de Bergeuin, G. Marot, C. Riekel, J. Susini, L. Zhang and E. Ziegler, Opt. Eng. 29, 928 (1990).
37. P. Kirkpatrick and V. Baez, J. Opt. Soc. Am. 38, 766 (1948).
38. Y. Suzuki, F. Uchida and Y. Hirai, Photon Factory 1989 Annual Report, Tsukubashi, Japan, Proposal 89-Y015 (1990).
39. A. Thompson, Center for X-ray Optics 1989 Annual Report, LBL-28001, Berkeley CA (1990).
40. M. Howells, Opt. Eng. 34, 410 (1995).
41. M. Howells, Lawrence Berkeley Laboratory Report, LBL-34750, Berkeley CA (1993).
42. D. Sayre, M. Howells, J. Kirz and H. Rarbeck (Eds), X-Ray Microscopy II. Springer, New York (1987).
43. R. M. Bionta, E. Ables, K. J. Cook, O. D. Edwards, P. C. Gabriele, A. F. Jankowski, D. M. Makawiecki, L. L. Ott and N. Thomas, SPIE 984, 247 (1988).
44. B. Lai, W. B. Yun, D. Legini, Y. Xiao, J. Chrzas, P. J. Viccaro, V. White, S. Bajikar, D. Denton, F. Cerrina, E. Difabrizio, M. Gentili, L. Grella and M. Baciocchi, Appl. Phys. Lett. 61, 1877 (1992).
45. W. B. Yun, personal communication.
46. W. B. Yun, P. J. Vicarro, B. Lai and J. Chrzas, Rev. Sci Instrum. 63, 582 (1992).
47. S. M. Kuznetsov, I. I. Snigireva, A. A. Snigirev, P. Engström and C. Riekel, Appl. Phys. Lett. 65, 827 (1994).
48. T. Tarazona, P. Elleaume, J. Chavanne, Y. M. Hartman, A. A. Snigirev and I. I. Snigireva, Rev. Sci. Instrum. 65, 1959 (1994).