High-resolution angular beam stability monitoring at a nanofocusing beamline

Journal of Synchrotron Radiation

Volumn 15, Issue 4, 2008, Pages 392-398

  Tucoulou, R ^a   Martinez Criado, G ^a   Bleuet, P ^a   Kieffer, I ^a   Cloetens, P ^a   Laboure S ^a   Martin, T ^a   Guilloud, C ^a   Susini, Jean ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Beam position monitoring; Nanoprobe; X ray camera

Indexed keywords

FREQUENCY STABILITY; LINEAR ACCELERATORS; MONOCHROMATORS; NANOPROBES; PARTICLE BEAM TRACKING; WIGGLERS;

BEAM POSITION MONITORING; BEAM POSITION MONITORS; BEAM STABILITY; BEAM-LINES; HIGH RESOLUTION; MICRO ANALYSIS; NANO-FOCUSING; SEMI-TRANSPARENT; STABILITY MONITORING; X-RAY CAMERA;

X RAY CAMERAS;

EID: 46149110830     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049508007486     Document Type: Article

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