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Volumn 3, Issue 3, 2007, Pages 182-185

Surface microstructuring of inclined trench structures of silica glass by laser-induced backside wet etching

Author keywords

DPSS UV laser; Equilateral prism; Galvanometer based point scanning; Laser induced back side wet etching (LIBWE); Oblique incidence; Silica glass

Indexed keywords


EID: 84882032639     PISSN: None     EISSN: 18800688     Source Type: Journal    
DOI: 10.2961/jlmn.2008.03.0010     Document Type: Article
Times cited : (8)

References (75)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.