Electron tweezers as a tool for high-precision manipulation of nanoobjects

Advances in Imaging and Electron Physics

Volumn 179, Issue , 2013, Pages 203-262

  Oleshko, Vladimir P ^a   Howe, James M ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b University of Virginia   (United States)

Author keywords

Electron tweezers; energy filtering transmission electron microscopy (EFTEM); liquids; manipulation; metal nanoparticles; plasmons; scanning transmission electron microscopy (S TEM); valence electron energy loss spectroscopy (VEELS)

Indexed keywords

ELECTRON BEAMS; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ENERGY DISSIPATION; FILTRATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LIQUIDS; METAL NANOPARTICLES; OPTICAL TWEEZERS; PLASMONS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC-RESOLUTION IMAGING; CONTROLLED MANIPULATIONS; ENERGY-FILTERING TRANSMISSION ELECTRON MICROSCOPIES; FOCUSED ELECTRON BEAMS; MANIPULATION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THREE ORDERS OF MAGNITUDE; VALENCE ELECTRON ENERGY-LOSS SPECTROSCOPIES;

ELECTRONS;

EID: 84881079641     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/B978-0-12-407700-3.00003-X     Document Type: Chapter

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