Transmission electron microscopy and diffractometry of materials

Transmission Electron Microscopy and Diffractometry of Materials

Volumn , Issue , 2008, Pages 1-758

  Fultz, Brent ^a   Howe, James M ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84892340887     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-3-540-73886-2     Document Type: Book

References (167)

1. C. C. Ahn, Ed.: Transmission Electron Energy Loss Spectroscopy in Materials Science and the EELS Atlas (Wiley-VCH, Weinheim 2004).
2. C. C. Ahn and O. L. Krivanek: EELS Atlas (Gatan, Inc., Pleasanton, CA 1983).
3. S. Amelinckx, R. Gevers and J. Van Landuyt: Diffraction and Imaging Techniques in Materials Science (North-Holland, Amsterdam 1978).
4. Leonid V. Azároff: Elements of X-Ray Crystallography (McGraw-Hill, New York 1968), reprinted by TechBooks, Fairfax, VA.
5. B. W. Batterman and H. Cole: Rev. Mod. Phys. 36, 681-717 (1964).
6. J. M. Cowley: Diffraction Physics, 2nd edn. (North-Holland Publishing, Amsterdam 1975).
7. B. D. Cullity and S. R. Stock: Elements of X-Ray Diffraction (Prentice-Hall, Upper Saddle River, NJ 2001).
8. M. De Graef: Introduction to Conventional Transmission Electron Microscopy (Cambridge University Press, Cambridge 2003).
9. M. M. Disko, C. C. Ahn and B. Fultz, Eds.: Transmission Electron Energy Loss Spectroscopy in Materials Science (Minerals, Metals & Materials Society, Warrendale, PA 1992).
10. J. A. Eades: 'Convergent-Beam Diffraction'. In: Electron Diffraction Techniques, Volume 1, ed. by J. M. Cowley (International Union of Crystallography, Oxford University Press, Oxford 1992).
11. J. W. Edington: Practical Electron Microscopy in Materials Science, 1. The Operation and Calibration of the Electron Microscope (Philips Technical Library, Eindhoven 1974).
12. J. W. Edington: Practical Electron Microscopy in Materials Science, 2. Electron Diffraction in the Electron Microscope (Philips Technical Library, Eindhoven 1975).
13. J.W. Edington: Practical Electron Microscopy in Materials Science, 3. Interpretation of Transmission Electron Micrographs (Philips Technical Library, Eindhoven 1975).
14. J. W. Edington: Practical Electron Microscopy in Materials Science, 4. Typical Electron Microscope Investigations (Philips Technical Library, Eindhoven 1976).
15. T. Egami and S. J. L. Billinge: Underneath the Bragg Peaks: Structural Analysis of Complex Materials (Pergamon Materials Series, Elsevier, Oxford 2003).
16. R. F. Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd edn. (Plenum Press, New York 1996).
17. C. T. Forwood and L. M. Clarebrough: Electron Microscopy of Interfaces in Metals and Alloys (Adam Hilger IOP Publishing Ltd., Bristol 1991).
18. P. J. Goodhews and F. J. Humphreys: Electron Microscopy and Microanalysis (Taylor & Francis Ltd., London 1988).
19. P. Grivet: Electron Optics, revised by A. Septier, translated by P. W. Hawkes (Pergamon, Oxford, 1965).
20. C. Hammond: The Basics of Crystallography and Diffraction (International Union of Crystallography, Oxford University Press, Oxford 1977).
21. A. K. Head, P. Humble, L. M. Clarebrough, A. J. Morton and C. T. Forwood: Computed Electron Micrographs and Defect Identification (North-Holland Publishing Company, Amsterdam 1973).
22. P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan: Electron Microscopy of Thin Crystals (R. E. Krieger, Malabar, Florida 1977).
23. J. J. Hren, J. I. Goldstein and D. C. Joy, Eds.: Introduction to Analytical Electron Microscopy (Plenum Press, New York 1979).
24. The International Union of Crystallography publishes the International Tables for X-ray Crystallography (Kynock Press, Birmingham, England, 1952)
25. O. Johari and G. Thomas: The Stereographic Projection and Its Applications (Interscience Publishers, JohnWiley & Sons, New York 1969).
26. D. C. Joy, A. D. Romig, Jr. and J. I. Goldstein, Eds.: Principles of Analytical Electron Microscopy (Plenum Press, New York 1986).
27. R. J. Keyse, A. J. Garratt-Reed, P. J. Goodhew and G. W. Lorimer: Introduction to Scanning Transmission Electron Microscopy (Springer BIOS Scientific Publishers Ltd., New York 1998).
28. Harold P. Klug and Leroy E. Alexander: X-Ray Diffraction Procedures (Wiley-Interscience, New York 1974).
29. M. A. Krivoglaz: Theory of X-Ray and Thermal Neutron Scattering by Real Crystals (Plenum, New York 1969).
30. M. H. Lorretto: Electron Beam Analysis of Materials (Chapman and Hall, London 1984).
31. A. J. F. Metherell: 'Diffraction of Electrons by Perfect Crystals', in Electron Microscopy in Materials Science II, ed. by U. Valdre and E. Ruedl (CEC Brussels 1975) pp. 387.
32. I. C. Noyan and J. B. Cohen: Residual Stress (Springer-Verlag, New York 1987).
33. S. J. Pennycook, D. E. Jesson, M. F. Chisholm, N. D. Browning, A. J. McGibbon, and M. M. McGibbon: 'Z-Contrast Imaging in the Scanning Transmission Electron Microscope', J. Micros. Soc. Amer. 1, 234 (1995).
34. H. Raether: Excitations of Plasmons and Interband Transitions by Electrons (Springer-Verlag, Berlin and New York 1980).
35. L. Reimer, Ed.: Energy-Filtering Transmission Electron Microscopy (Springer-Verlag, Berlin 1995).
36. L. Reimer: Transmission Electron Microscopy: Physics of Image Formation and Microanalysis, 4th edn. (Springer-Verlag, New York 1997).
37. P. Schattschneider: Fundamentals of Inelastic Electron Scattering (Springer-Verlag, Vienna, New York 1986).
38. L. H. Schwartz and J. B. Cohen: Diffraction from Materials (Springer-Verlag, Berlin 1987).
39. F. G. Smith and J. H. Thomson: Optics, 2nd edn. (John Wiley & Sons, New York 1988).
40. J. C. H. Spence: Experimental High-Resolution Electron Microscopy, 2nd edn. (Oxford Univ. Press, New York 1988).
41. J. C. H. Spence and J. M. Zuo: Electron Microdiffraction (Plenum Press, New York 1992).
42. G. L. Squires: Introduction to the Theory of Thermal Neutron Scattering (Dover, Mineola, New York 1996).
43. J. W. Steeds: 'Convergent Beam Electron Diffraction'. In: Introduction to Analytical Electron Microscopy, ed. by J. J. Hren, J. I. Goldstein, D. C. Joy (Plenum Press, New York 1979) p. 401.
44. J. W. Steeds and R. Vincent: 'Use of High-Symmetry Zone Axes in Electron Diffraction in Determining Crystal Point and Space Groups', J. Appl. Cryst. 16, 317 (1983).
45. M. Tanaka and M. Terauchi: Convergent-Beam Electron Diffraction (JEOL Ltd., Nakagami, Tokyo 1985).
46. M. Tanaka, M. Terauchi and T. Kaneyama, Convergent-Beam Electron Diffraction II (JEOL Ltd., Musashino 3-chome, Tokyo 1988).
47. G. Thomas and M. J. Goringe: Transmission Electron Microscopy of Materials (Wiley-Interscience, New York 1979).
48. B. E. Warren: X-Ray Diffraction (Addison-Wesley, Reading, MA 1969)
49. Dover reprint (Dover, New York, 1990).
50. D. B. Williams: Practical Analytical Electron Microscopy in Materials Science (Philips Electron Instruments, Inc., Mahwah, NJ 1984).
51. D. B. Williams and C. B. Carter: Transmission Electron Microscopy: A Textbook for Materials Science (Plenum Press, New York 1996).
52. International Centre for Diffraction Data, 12 Campus Boulevard Newtown Square, PA 19073-3273 USA. http://www.icdd.com
53. H. G. J. Moseley: Philos. Mag. 27, 713 (1914).
54. F. Richtmyer and E. Kennard: Introduction to Modern Physics (McGraw-Hill, New York 1947).
55. A partial list of web sites for synchrotron sources includes (prefixed with http:// ): aps.anl.gov/, www.esrf.eu/, www.spring8.or.jp/, www-hasylab.desy.de/, slac.stanford.edu/, www.srs.ac.uk/srs/ www.bessy.de/, www.nsls.bnl.gov/, www.als.lbl.gov/, ssrc.inp.nsk.su/
56. Leonid V. Azároff: Elements of X-Ray Crystallography (McGraw-Hill, New York 1968). Figure reprinted with the courtesy of TechBooks, Fairfax, VA.
57. National Institute of Standards and Technology, Standard Reference Materials Program, Bldg. 202, Rm 204, Gaithersburg, MD 20899. http://ts.nist.gov/srm
58. J. Nelson and D. Riley: Proc. Phys. Soc. (London) 57, 160 (1945).
59. Harold P. Klug and Leroy E. Alexander: X-Ray Diffraction Procedures (Wiley-Interscience, New York 1974). Figure reprinted with the courtesy of John Wiley-Interscience.
60. B. Demczyk: Ultramicros., 47, 433 (1993). Figure reprinted with the courtesy of Elsevier Science Publishing B.V.
61. J. M. Howe, W. E. Benson, A. Garg and Y. C. Chang: Mater. Sci. Forum, 189-90, 255 (1995). Figure reprinted with the courtesy of Trans Tech Publications Ltd.
62. Near the year 2007, manufacturers of TEM instruments include JEOL, FEI, Hitachi and Zeiss. A partial list of web sites for manufacturers of TEM instruments includes: www.jeol.com/, www.fei.com/, www.hitachi-hta.com/, www.smt.zeiss.com/ Figure reprinted with the courtesy of FEI Company.
63. P. J. Goodhew and F. J. Humphreys: Electron Microscopy and Analysis, 2nd edn. (Taylor & Francis, Ltd., London 1975). Figure reprinted with the courtesy of Taylor & Francis, Ltd. Figure reprinted with the courtesy of Prof. M. K. Hatalis.
64. M. Bilaniuk and J. M. Howe: Interface Sci., 6, 328 (1998). Figure reprinted with the courtesy of Kluwer Academic Publishers.
65. D. B. Williams: Practical Analytical Electron Microscopy in Materials Science (Philips Electron Optics Publishing Group, Mahwah, NJ 1984). Figure reprinted with the courtesy of FEI Company. Figure courtesy of Dr. Simon Nieh.
66. L. Reimer: Transmission Electron Microscopy: Physics of Image Formation and Microanalysis, 4th edn. (Springer-Verlag, New York 1997). Figure reprinted with the courtesy of Springer-Verlag.
67. F. W. Sears and M. W. Zemansky: University Physics, 4th edn. (Addison-Wesley-Longman Publishing, Reading, MA 1973). Figure reprinted with the courtesy of Addison-Wesley-Longman Publishing.
68. J. W. Edington: Practical Electron Microscopy in Materials Science, 1. The Operation and Calibration of the Electron Microscope (Philips Technical Library, Eindhoven 1975). Figure reprinted with the courtesy of FEI Company.
69. Figure reproduced with the courtesy of the Huntington Library, Art Collections, and Botanical Gardens, San Marino, CA.
70. J. C. H. Spence: Acta Cryst. A49, 231 (1993).
71. J. M. Zuo, M. Kim, M. O'Keefe, and J. C. H. Spence: Nature 401, 49 (1999). Figure reproduced with the courtesy of Nature and J. C. H. Spence.
72. U. Kriplani: Kinematical Mossbauer Diffraction from Polycrystalline 57Fe. Ph.D. Thesis, California Institute of Technology, California (2000).
73. D. H. Pearson: Measurements of White Lines in Transition Metals and Alloys using Electron Energy Loss Spectrometry. Ph.D. Thesis, California Institute of Technology, California (1991). Figure reprinted with the courtesy of Dr. D. H. Pearson.
74. M. M. Disko: 'Transmission Electron Energy-Loss Spectrometry in Materials Science'. In: Transmission Electron Energy Loss Spectroscopy in Materials Science, ed. by M. M. Disko, C. C. Ahn and B. Fultz (Minerals, Metals & Materials Society, Warrendale, PA 1992). Reprinted with courtesy of The Minerals, Metals & Materials Society.
75. J. K. Okamoto: Temperature-Dependent Extended Electron Energy Loss Fine Structure Measurements from K, L23, and M45 Edges in Metals, Intermetallic Alloys, and Nanocrystalline Materials. Ph.D. Thesis, California Institute of Technology, California (1993). Figure reprinted with the courtesy of Dr. J. K. Okamoto.
76. A. Hightower: Lithium Electronic Environments in Rechargeable Battery Electrodes. Ph.D. Thesis, California Institute of Technology, California (2000).
77. R. F. Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd edn. (Plenum Press, New York 1996). Figures reprinted with the courtesy of Plenum Press.
78. D. B.Williams and C. B. Carter: Transmission Electron Microscopy: A Textbook for Materials Science (Plenum Press, New York 1996). Figure reprinted with the courtesy of Plenum Press.
79. R. D. Leapman: 'EELS Quantitative Analysis'. In: Transmission Electron Energy Loss Spectroscopy in Materials Science, ed. by M. M. Disko, C. C. Ahn and B. Fultz (Minerals, Metals & Materials Society, Warrendale, PA 1992). Reprinted with courtesy of The Minerals, Metals & Materials Society. Figure reprinted with the courtesy of K. T. Moore.
80. D. B. Williams: Practical Analytical Electron Microscopy in Materials Science (Philips Electron Optics Publishing Group, Mahwah, NJ 1984). Figure reprinted with the courtesy of FEI Company.
81. E. H. S. Burhop: The Auger Effect and Other Radiationless Transitions (Cambridge University Press 1952). Figure reprinted with the permission of Cambridge University Press. Figure reprinted with the courtesy of Dr. K. M. Krishnan.
82. Figure reprinted with the courtesy of C. M. Garland.
83. C. Nockolds, M. J. Nasir, G. Cliff and G. W. Lorimer, In: Electron Microscopy and Analysis-1979, ed. by T. Mulvey (The Institute of Physics, Bristol and London, 1980) p. 417.
84. J. M. Howe and R. Gronsky: Scripta Metall., 20, 1168 (1986). Figure reprinted with the courtesy of Elsevier Science Ltd.
85. The International Union of Crystallography: International Tables for X-ray Crystallography (Kynock Press, Birmingham, England, 1952-). Figure reprinted with the courtesy of Dr. S. R. Singh.
86. Y. C. Chang: Crystal Structure and Nucleation Behavior of {111} Precipitates in an Al-3.9Cu-0.5Mg-0.5Ag Alloy. Ph.D. Thesis, Carnegie Mellon University, Pittsburgh, PA (1993). Figure reprinted with the courtesy of Dr. Y. C. Chang.
87. R. J. Rioja and D. E. Laughlin: Metall. Trans., 8A, 1259 (1977). Figure reprinted with the courtesy of The Minerals, Metals and Materials Society.
88. G. Thomas and M. J. Goringe: Transmission Electron Microscopy of Materials (Wiley-Interscience, New York 1979). Figure reprinted with the courtesy of Wiley-Interscience. Figure and problem reprinted with the courtesy of Prof. D. E. Laughlin.
89. F. K. LeGoues,H. I. Aaronson,Y. W. Lee andG. J.Fix: In: Proceedings of the International Conference on Solid-Solid Phase Transformations ed. by H. I. Aaronson, D. E. Laughlin, R. F. Sekerka and C. M. Wayman (TMS-AIME, Warrendale, PA 1982) p. 427. Figure reprinted with the courtesy of The Minerals, Metals and Materials Society.
90. G. Thomas and M. J. Goringe: Transmission Electron Microscopy of Materials (Wiley-Interscience, New York 1979). Figure reprinted with the courtesy of Wiley-Interscience.
91. J. W. Edington: Practical Electron Microscopy in Materials Science, 2. Electron Diffraction in the Electron Microscope (Philips Technical Library, Eindhoven 1975). Figure reprinted with the courtesy of FEI Company.
92. Dr. J.-S. Chen, unpublished results.
93. M. Tanaka and M. Terauchi: Convergent-Beam Electron Diffraction (JEOL Ltd., Nakagami, Tokyo 1985). Figures reprinted with the courtesy of JEOL, Ltd. Worked thickness example on pp. 38-39.
94. R. Ayer: J. Electron Micros. Tech. 13, 16 (1989). Figure reprinted with the courtesy of Alan R. Liss, Inc.
95. S. J. Rozeveld: Measurement of Residual Stress in an Al-SiCw Composite by Convergent-Beam Electron Diffraction, Ph.D. Thesis, Carnegie-Mellon University, Pittsburgh, PA (1991). Figure reprinted with the courtesy of Dr. S. J. Rozeveld.
96. B. F. Buxton, et al.: Proc. Roy. Soc. London A281, 188 (1976).
97. B. F. Buxton, et al.: Phil. Trans. Roy. Soc. London, A281, 171 (1976).
98. M. Tanaka, H. Sekii and T. Nagasawa: Acta Cryst. A39, 825 (1983).
99. M. Tanaka, R. Saito and H. Sekii: Acta Cryst. A39, 359 (1983).
100. J.M. Howe,M. Sarikaya and R. Gronsky: Acta Cryst. A42, 371 (1986).
101. The International Union of Crystallography: International Tables for X-ray Crystallography (Kynock Press, Birmingham, England, 1952-).
102. J. W. Steeds and R. Vincent: 'Use of High-Symmetry Zone Axes in Electron Diffraction in Determining Crystal Point and Space Groups', J. Appl. Cryst. 16 317 (1983).
103. J. Gjønnes and A. F. Moodie: Acta Cryst. 19, 65 (1965).
104. M. J. Kaufman and H. L. Fraser: Acta Metall. 33, 194 (1985).
105. P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan: Electron Microscopy of Thin Crystals (R. E. Krieger, Malabar, Florida 1977).
106. J. W. Edington: Practical Electron Microscopy in Materials Science, 3. Interpretation of Transmission Electron Micrographs (Philips Technical Library, Eindhoven 1975). Figure reprinted with the courtesy of FEI Company. Figure reprinted with the courtesy of Dr. Y. C. Chang.
107. G. Thomas and M. J. Goringe: Transmission Electron Microscopy of Materials (Wiley-Interscience, New York 1979). Figure reprinted with the courtesy of Dr. S. R. Singh.
108. J. M. Howe, H. I. Aaronson and R. Gronsky: Acta Metall. 33, 641 (1985).
109. P. B. Hirsch, A. Howie and M. J. Whelan: Phil. Trans. Royal Soc. (London) 252A, 499 (1960).
110. D. J. H. Cockayne, I. L. F. Ray, and M. J. Whelan: Philos. Mag. 20, 1265 (1969).
111. D. J. H. Cockayne, M. L. Jenkins, and I. L. F. Ray: Philos. Mag. 24, 1383 (1971).
112. L. Reimer: Transmission Electron Microscopy: Physics of Image Formation and Microanalysis, 4th edn. (Springer-Verlag, New York 1997).
113. A. Garg and J. M. Howe: Acta Metall. Mater. 39, 1934 (1991).
114. A. Garg, Y. C. Chang and J. M. Howe: Acta Metall. Mater. 41, 240 (1993).
115. J. W. Edington: Practical Electron Microscopy in Materials Science, 3. Interpretation of Transmission Electron Micrographs (Philips Technical Library, Eindhoven 1975) p. 40.
116. R. Gevers, A. Art and S. Amelinckx: Phys. Stat. Sol. 3, 1563 (1963).
117. N. Prabhu and J. M. Howe: Philos. Mag. A 63, 650 (1991).
118. M. F. Ashby and Brown: Philos. Mag. 8, 1083 (1963).
119. H. P. Degischer: Philos. Mag. 26, 1147 (1972).
120. M. Hwang, D. E. Laughlin and I. M. Bernstein: Acta Metall. 28, 629 (1980). Figure reprinted with the courtesy of Dr. A. Garg.
121. H. P. Klug and L. E. Alexander: X-Ray Diffraction Procedures (Wiley-Interscience, New York 1974) pp. 687-692.
122. H. P. Klug and L. E. Alexander: X-Ray Diffraction Procedures (Wiley-Interscience, New York 1974) pp. 655-665.
123. B. E.Warren: X-Ray Diffraction (Dover, New York, 1990) pp. 251-275.
124. H. Frase: Vibrational and Magnetic Properties of Mechanically Attrited Ni3Fe Nanocrystals. Ph.D. Thesis, California Institute of Technology, California (1998).
125. B. E.Warren: X-Ray Diffraction (Dover, New York, 1990) pp. 178-193.
126. F. Ducastelle: Order and Phase Stability in Alloys (North-Holland, Amsterdam 1991) pp. 439-442.
127. J. A. Rodriguez, S. C. Moss, J. L. Robertson, J. R. D. Copley, D. A. Neumann and J. Major: Phys. Rev. B 74, 104115 (2006).
128. B. E.Warren: X-Ray Diffraction (Dover, New York, 1990) pp. 206-250.
129. L. H. Schwartz and J. B. Cohen: Diffraction from Materials (Springer-Verlag, Berlin 1987) pp. 407-409.
130. J. M. Cowley: Diffraction Physics, 2nd edn. (North-Holland Publishing, Amsterdam 1975) pp. 152-154.
131. A. Williams: Atomic Structure of Transition Metal Based Metallic Glasses. Ph.D. Thesis, California Institute of Technology, California (1981).
132. H. P. Klug and L. E. Alexander: X-Ray Diffraction Procedures (Wiley-Interscience, New York 1974) pp. 791-859.
133. T. Egami: 'PDF Analysis Aplied to Crystalline Materials', in: Local Structure from Diffraction, ed. by S. J. L. Billinge and M. F. Thorpe (Plenum, New York 1998) pp. 1-21.
134. A. Guinier: X-Ray Diffraction in Crystals, Imperfect Crystals, and Amorphous Bodies (Dover, New York 1994) pp. 344-349.
135. J. M. Cowley and A. F. Moodie: Acta Cryst. 10, 609 (1957).
136. M. A. O'Keefe: 'Electron image simulation; a complementary processing technique'. In: Proceedings of the 3rd Pfeffercorn Conference on Electron Optical Systems, Ocean City, MD ed. by J. J. Hren, F. A. Lenz, E. Munro, P. B. Sewell, and S. A. Bhatt (Scanning Electron Microscopy, Inc., Illinois 1984) pp. 209-220.
137. R. R. Meyer, J. Sloan, R. E. Dunin-Borkowski, A. I. Kirkland, M. C. Novotny, S. R. Bailey, J. L. Hutchison and M. L. H. Green: Science 289, 1324 (2000).
138. S. D. Hudson, H. T. Jung, V. Percec, W. D. Cho, G. Johansson, G. Ungar, V. S. K. Balagurusamy: Science 278, 449 (1997).
139. S. R. Singh and J. M. Howe: Philos. Mag. A 66, 746 (1992).
140. S. Das, J. M. Howe and J. H. Perepezko: Metall. Mater. Trans. 27A, 1627 (1996).
141. G. Rao, J. M. Howe and P. Wynblatt, unpublished research.
142. U. Dahmen: Micros. Soc. Amer. Bull. 24, 341 (1994). Figure reprinted with the courtesy of R. Gronsky and D. Acklund.
143. J. M. Howe and S. J. Rozeveld: J. Micros. Res. Tech. 23, 233 (1992).
144. M. M. Tsai: Determination of the Growth Mechanisms of TiH in Ti Using High-Resolution and Energy-Filtering Transmission Electron Microscopy. Ph.D. Thesis, University of Virginia, Charlottesville, VA (1997).
145. such as Gatan Digital MicrographTM or NIH Image.
146. B. Laird and J. M. Howe, unpublished research.
147. R. Kilaas and R. Gronsky: Ultramicros. 16, 193 (1985).
148. J.O. Malm and M.A. O'Keefe: Ultramicros. 68, 13 (1997).
149. S.-C.Y. Tsen, P.A. Crozier and J. Liu: Ultramicros. 98, 63 (2003).
150. After N. D. Browning, D. J. Wallis, P. D. Nellist and S. J. Pennycook: Micron 28, 334 (1997). Reprinted with the courtesy of Elsevier Science Ltd.
151. S. J. Pennycook, D. E. Jesson,M. F. Chisholm, N. D. Browning, A. J. McGibbon, and M. M. McGibbon: J. Micros. Soc. Amer. 1, 234 (1995). Reprinted with the courtesy of Microscopy Society of America.
152. A. Amali and P. Rez: Microsc. and Microanal. 3, 28 (1997).
153. A.R. Lupini and S. J. Pennycook: Ultramicroscopy 96, 313 (2003).
154. P. M. Voyles and D. A. Muller, private communication.
155. See also P. M. Voyles, D. A. Muller, J. L. Grazul, P. H. Citrin, and H-.J. L. Gossmann: Nature 416, 826 (2002).
156. O.L. Krivanek, N. Dellby, and A.R. Lupini: Ultramicroscopy 78, 1 (1999).
157. S. Uhlemann and M. Haider: Ultramicroscopy 72, 109 (1998).
158. Q.M. Ramasse and A.L. Bleloch, Ultramicroscopy 106, 37 (2005).
159. H. Müller, S. Uhlemann, P. Hartel and M. Haider: Microsc. and Microanal. 12, 442 (2006).
160. M. Lentzen: Microsc. Microanal. 12, 191 (2006).
161. A.Y. Borisevich, A.R. Lupini and S.J. Pennycook: Proc. Nat. Acad. Sci. 103, 3044 (2006).
162. K. van Benthem, A.R. Lupini, M. Kim, K.-S. Baik, S. Doh, J.-H. Lee, M.P. Oxley, S.D. Findlay, L.J. Allen, J.T. Luck and S. J. Pennycook: Appl. Phys. Lett. 87, 034104 (2005). Reprinted with the courtesy of the American Institute of Physics.
163. N.D. Browning, R.P. Erni, J.C. Idrobo, A. Ziegler, C.F. Kisielowski, R.O. Ritchie: Microsc. Microanal. 11 (Suppl 2), 1434 (2005). Figure reprinted with the courtesy of Dr. Y. C. Chang.
164. P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan: Electron Microscopy of Thin Crystals (R. E. Krieger,Malabar, Florida 1977) pp. 222-242.
165. N. Prabhu and J. M. Howe: Philos. Mag. A 63, 650 (1991).
166. A. W. Wilson: Microstructural Examination of NiAl Alloys. Ph.D. Thesis, University of Virginia, Charlottesville, VA (1999).
167. Peter Rez, private communication of academic course notes.