Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging

Nature Communications

Volumn 3, Issue , 2012, Pages

  Humphry, M J ^a   Kraus, B ^b   Hurst, A C ^a   Maiden, A M ^a,c   Rodenburg, J M ^a,c  

^a Phasefocus Ltd   (United Kingdom)

^b GATAN INC   (United States)

^c UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DIFFRACTION; ELECTRIC POTENTIAL; ELECTRON MICROSCOPY; ELECTRON PTYCHOGRAPHY; ENERGY; ILLUMINATION; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; LENS; MATHEMATICAL ANALYSIS; MOLECULAR IMAGING; NANOANALYSIS; OPTICS; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84859207477     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms1733     Document Type: Article

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