Are electron tweezers possible?

Ultramicroscopy

Volumn 111, Issue 11, 2011, Pages 1599-1606

  Oleshko, Vladimir P ^a   Howe, James M ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b University of Virginia   (United States)

Author keywords

EFTEM; Electron tweezers; Manipulation; Metal alloys; Nanoparticles; Plasmons; VEELS

Indexed keywords

AL-NANOPARTICLES; AL-SI EUTECTIC ALLOYS; ALLOY PARTICLES; ANALYTICAL TRANSMISSION ELECTRON MICROSCOPE; ATOMIC LEVELS; BEAM TRAPPING; CRITICAL THRESHOLD; EFTEM; ELECTRON OPTICAL SYSTEM; ENERGY FILTERING; FOCUSED ELECTRON BEAMS; IN-SITU; INTERNAL STRUCTURE; LATERAL RESOLUTION; LIQUID ALLOY; MANIPULATION; MELTING AND CRYSTALLIZATION; METAL ALLOYS; METAL NANOPARTICLES; NANO SCALE; NANO-DEVICES; NANO-OBJECTS; PLASMON LOSS; POTENTIAL APPLICATIONS; REAL TIME; RESEARCH DIRECTIONS; SINGLE ELECTRON; SOLID NANOPARTICLES; SOLID-LIQUID INTERFACES; SUBMICRON-SIZED; TEMPERATURE DEPENDENCE; THREE ORDERS OF MAGNITUDE; VALENCE ELECTRON ENERGY-LOSS SPECTROSCOPIES; VEELS;

ALUMINUM; BINARY ALLOYS; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; FILTRATION; LIQUIDS; MELTING; NANOPARTICLES; OPTICAL PROPERTIES; OPTICAL TWEEZERS; PHASE INTERFACES; PLASMONS; SILICON ALLOYS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONS;

ALLOY; NANOPARTICLE; SILICON;

ARTICLE; CRYSTALLIZATION; DENSITY; DIELECTRIC CONSTANT; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON TWEEZER; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; MATHEMATICAL ANALYSIS; MELTING POINT; NANOTECHNOLOGY; OPTICAL TWEEZERS; SURGICAL EQUIPMENT; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 80053343786     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.08.015     Document Type: Article

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