Subparticle ultrafast spectrum imaging in 4D electron microscopy

Science

Volumn 335, Issue 6064, 2012, Pages 59-64

  Yurtsever, Aycan ^a   Van Der Veen, Renske M ^a   Zewail, Ahmed H ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; SILVER NANOPARTICLE;

CELL ORGANELLE; COPPER; ELECTRON; ENERGY EFFICIENCY; FOUR-DIMENSIONAL MODELING; MOLECULAR ANALYSIS; PARTICULATE MATTER; SCANNING ELECTRON MICROSCOPY; SPATIAL RESOLUTION; SPECTRAL ANALYSIS;

ARTICLE; ELECTRON; ELECTRON MICROSCOPY; FOUR DIMENSIONAL ELECTRON MICROSCOPY; IMAGING; PHOTON; PRIORITY JOURNAL; SPECTRUM IMAGING;

EID: 84855485016     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1213504     Document Type: Article

References (32)

1. J. M. Thomas, P. A. Midgley, Chem. Phys. 385, 1 (2011).
2. C. Colliex et al., Philos. Trans. R. Soc. A 367, 3845 (2009).
3. D. A. Muller et al., Science 319, 1073 (2008).
4. C. Colliex, Nature 450, 622 (2007).
5. S. A. Maier, Plasmonics: Fundamentals and Applications (Springer, New York, 2007).
6. H. A. Atwater, A. Polman, Nat. Mater. 9, 205 (2010).
7. S. W. Hell, Science 316, 1153 (2007).
8. B. Huang, M. Bates, X. Zhuang, Annu. Rev. Biochem. 78, 993 (2009).
9. W. Min et al., Nature 461, 1105 (2009).
10. P. E. Batson, N. Dellby, O. L. Krivanek, Nature 418, 617 (2002).
11. Ç. Ö. Girit et al., Science 323, 1705 (2009).
12. J. C. H. Spence, Rep. Prog. Phys. 69, 725 (2006).
13. R. F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum, New York, 1996).
14. P. E. Batson, Nature 366, 727 (1993).
15. D. A. Muller, Y. Tzou, R. Raj, J. Silcox, Nature 366, 725 (1993).
16. K. Suenaga et al., Science 290, 2280 (2000).
17. M. Varela et al., Phys. Rev. Lett. 92, 095502 (2004).
18. K. Kimoto et al., Nature 450, 702 (2007).
19. J. Nelayah et al., Nat. Phys. 3, 348 (2007).
20. A. Yurtsever, M. Couillard, D. A. Muller, Phys. Rev. Lett. 100, 217402 (2008).
21. A. H. Zewail, Science 328, 187 (2010).
22. A. H. Zewail, J. M. Thomas, 4D Electron Microscopy (Imperial College Press, London, 2009).
23. A. Yurtsever, A. H. Zewail, Science 326, 708 (2009).
24. A. Yurtsever, A. H. Zewail, Proc. Natl. Acad. Sci. U.S.A. 108, 3152 (2011).
25. V. Ortalan, A. H. Zewail, J. Am. Chem. Soc. 133, 10732 (2011).
26. B. Barwick, D. J. Flannigan, A. H. Zewail, Nature 462, 902 (2009).
27. F. J. García de Abajo, A. Asenjo-Garcia, M. Kociak, Nano Lett. 10, 1859 (2010).
28. S. T. Park, M. M. Lin, A. H. Zewail, New J. Phys. 12, 123028 (2010).
29. A. Howie, Eur. Phys. J. Appl. Phys. 54, 33502 (2011).
30. In general, the peaks of gain and loss for different photon quanta are well separated in energy in the raw data, but for quantification of intensities we applied the Richardson-Lucie deconvolution algorithm, which enabled use of the ZLP profile at negative time to quantify the evolution of peaks at each positive time.
31. N. Yamamoto, K. Araya, F. J. García de Abajo, Phys. Rev. B 64, 205419 (2001).
32. In diffraction, beyond the one-electron kinematical regime, different Bragg peaks can exhibit a correlation in intensities depending on the strength of the projected Coulomb potential, leading to a complex behavior. In other words, because of multiple electron scattering, the intensities of different Bragg peaks essentially become interactive, with an increase in the intensity for some peaks and a decrease in others, depending on the specimen and its thickness.