|
|
Volumn 371, Issue , 2012, Pages
|
|
Characterization of plasmonic nanostructures by analytical TEM
a
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
ELECTRON ENERGY LEVELS;
ELECTRON MICROSCOPES;
ELECTRON MICROSCOPY;
ELECTRON SCATTERING;
ELECTRONS;
ENERGY DISPERSIVE SPECTROSCOPY;
ENERGY DISSIPATION;
GOLD DEPOSITS;
IMAGE RECONSTRUCTION;
NANOPARTICLES;
NANOSTRUCTURES;
PLASMONS;
SEMICONDUCTING SILICON;
SILICON CARBIDE;
SPECTRUM ANALYSIS;
SUBSTRATES;
X RAY SPECTROSCOPY;
ATOMIC-SCALE RESOLUTION;
ENERGY DISPERSIVE X RAY SPECTROSCOPY;
ENERGY FILTERED TEM;
GOLD NANOPARTICLES;
HIGH-RESOLUTION IMAGING;
METALLIC NANOPARTICLES;
PLASMONIC NANOSTRUCTURES;
SEMICONDUCTOR SUBSTRATE;
ELECTRON ENERGY LOSS SPECTROSCOPY;
|
|
EID: 84865405866
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/371/1/012078 Document Type: Conference Paper |
|
Times cited : (2)
|
|
References (9)
|
