Quantitative valence plasmon mapping in the TEM: Viewing physical properties at the nanoscale

Ultramicroscopy

Volumn 96, Issue 3-4, 2003, Pages 547-558

  Daniels, H R ^a   Brydson, R ^a   Brown, A ^a   Rand, B ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

Carbon; EELS; EFTEM; Physical properties; Plasmon

Indexed keywords

ANISOTROPY; ELECTRON ENERGY LOSS SPECTROSCOPY; GRAPHITE; HEAT TREATMENT; INTERFACES (MATERIALS); MICROSTRUCTURE; OPTICAL RESOLVING POWER;

GRAPHITISATION; PLASMON MAPPING TECHNIQUE;

TRANSMISSION ELECTRON MICROSCOPY;

CARBON; GRAPHITE; STEEL;

ANISOTROPY; CONFERENCE PAPER; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY; FIBER; HEAT TREATMENT; IONIZATION; MEASUREMENT; PHYSICAL PARAMETERS; PLASMON MAPPING; QUANTITATIVE ANALYSIS; SAMPLE; SPECTRUM; TECHNIQUE; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037825643     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00115-3     Document Type: Conference Paper

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