Sub-nanometer free electrons with topological charge

Ultramicroscopy

Volumn 115, Issue , 2012, Pages 21-25

  Schattschneider, P ^a   Stoger Pollach M ^a   Loffler S ^a   Steiger Thirsfeld, A ^a   Hell, J ^a   Verbeeck, J ^b  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Aberrations; Partial coherence; Topological charge; Vortex beams

Indexed keywords

ELECTRON VORTEX; EXPERIMENTAL PARAMETERS; FREE ELECTRON; FREELY MOVING; NANO METER RANGE; PARTIAL COHERENCE; SPHERICAL ABERRATIONS; TOPOLOGICAL CHARGES; VORTEX BEAMS;

ABERRATIONS; ELECTRONS; OPTICS; TOPOLOGY;

VORTEX FLOW;

ARTICLE; ELECTRON; ELECTRON BEAM; ELECTRON VORTEX BEAM; PARTIAL COHERENCE; PHYSICAL PARAMETERS; PHYSICAL PHENOMENA; SIMULATION; SPHERIC ABERRATION; TOPOLOGICAL CHARGE;

EID: 84859824113     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.01.010     Document Type: Article

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