In-situ extended energy-loss fine structure analysis of the solid and liquid phases in sub-micron Al particles

Journal of Applied Physics

Volumn 110, Issue 10, 2011, Pages

  Palanisamy, Prakash ^a   Howe, James M ^a  

^a University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANHARMONIC; ATOMIC DISTANCES; CALCULATED VALUES; EXTENDED ENERGY-LOSS FINE STRUCTURE; GAUSSIAN SHAPE; HIGH TEMPERATURE; IN-SITU; LIQUID PHASIS; NEAREST-NEIGHBORS; PLASMON ENERGY; PURE AL; STRUCTURAL DISORDERS; SUBMICRON; THERMAL DISORDER; THERMAL VIBRATION; TRANSMISSION ELECTRON MICROSCOPE; VOLUME PLASMON;

ALUMINUM; BEHAVIORAL RESEARCH; DISTRIBUTION FUNCTIONS; GERMANIUM ALLOYS; PLASMONS; SUPERCOOLING; THERMAL EXPANSION; TRANSMISSION ELECTRON MICROSCOPY; VIBRATION ANALYSIS;

LIQUIDS;

EID: 82555165204     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3662382     Document Type: Conference Paper

References (42)

1. B. T. Fultz and J. M. Howe, Transmission Electron Microscopy and Diffractometry of Materials, 2nd ed. (Springer-Verlag, Berlin, 2002).
2. R. K. Garg, A. Claverie, and G. Balossier. Microsc. Microanal. Microstruct. 1, 55 (1990). 10.1051/mmm:019900010105500
3. M. Sarikaya, M. Qian, and E. A. Stern. Micron. 27, 449 (1996). 10.1016/S0968-4328(96)00044-3 (Pubitemid 27299345)
4. M. M. Disko, G. Meitzner, C. C. Ahn, and O. L. Krivanek. Appl. Phys. Lett. 65, 3295 (1989).
5. M. Diociaiuti, P. Picozzi, S. Santucci, L. Lozzi, and M. de Crescenzi. J. Microsc. 166, 231 (1992). 10.1111/j.1365-2818.1992.tb01521.x
6. Transmission Electron Energy Loss Spectroscopy in Materials Science and the EELS Atlas, edited by, C. C. Ahn, 2nd ed. (Wiley VCH, Berlin, 2004), p. 301.
7. F. M. Alamgir, H. Jain, D. B. Williams, and R. B. Schwarz. Micron. 34, 433 (2003). 10.1016/S0968-4328(03)00100-8 (Pubitemid 37425025)
8. E. A. Stern. Phys. Rev. B. 10, 3027 (1974). 10.1103/PhysRevB.10.3027
9. C. Gamertsfelder. J. Chem. Phys. 9, 450 (1941). 10.1063/1.1750933
10. E. D. Crozier and A. J. Seary, Can. J. Phys. 58, 1388 (1980).
11. S. Krishnan, S. Ansell, J. J. Felton, K. J. Volin, and D. L. Price. Phys. Rev. Lett. 81, 586 (1998). 10.1103/PhysRevLett.81.586
12. N. Jakse, L. Hennet, D. L. Price, S. Krishnan, T. Key, E. Artacho, B. Glorieux, A. Pasturel, and M.-L. Sabungi. Appl. Phys. Lett. 83, 4734 (2003). 10.1063/1.1631388
13. A. Filipponi and A. Di Cicco. Phys. Rev. B. 51, 12322 (1995). 10.1103/PhysRevB.51.12322
14. T. H. Kim and K. F. Kelton. J. Chem. Phys. 126, 054513 (2007). 10.1063/1.2431173
15. I. J. Polmear. Light Alloys: Metallurgy of the Light Metals. 3rd ed. (John Wiley Sons, New York, 1995).
16. D. Turnbull and R. E. Cech. J. Appl. Phys. 21, 804 (1950). 10.1063/1.1699763
17. J. H. Perepezko. Mater. Sci. Eng. 65, 125 (1984). 10.1016/0025-5416(84) 90206-4
18. P. Palanisamy and J. M. Howe. J. Appl. Phys, 110, 024908 (2011). 10.1063/1.3609063
19. Valimet, Inc., 431 East Sperry Road, Stockton, CA, 95206.
20. Transmission Electron Energy Loss Spectroscopy in Materials Science and the EELS Atlas, edited by, C. C. Ahn, 2nd ed. (Wiley VCH, Berlin, 2004), p. 300.
21. T. Stockli, P. Stadelmann, and A. Chatelain. Microsc. Microanal. Microstruct. 8, 145 (1997). 10.1051/mmm:1997113
22. R. F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd ed. (Plenum, New York, 1996).
23. H. Raether, Excitations of Plasmons and Interband Transitions by Electrons (Springer-Verlag, Berlin, 1980).
24. M. S. Moreno, K. Jorissen, and J. J. Rehr. Micron. 38, 1 (2007). 10.1016/j.micron.2006.03.011 (Pubitemid 44572738)
25. G. Beni and P.M. Platzman. Phys. Rev. B 14, 9514 (1976). 10.1103/PhysRevB.14.1514
26. V. Serin, G. Zanchi, and J. Sevely. Microsc. Microanal. Microstruct. 3, 201 (1992). 10.1051/mmm:0199200302-3020100
27. D. Haskel, M. Sarikaya, M. Qian, and E. A. Stern. Ultramicroscopy. 58, 353 (1995). 10.1016/0304-3991(95)00011-O
28. E. Sevillano, H. Meuth, and J. J. Rehr. Phys. Rev. B. 20, 4908 (1979). 10.1103/PhysRevB.20.4908
29. E.D. Crozier, F.W. Lytle, D.E. Sayers, and E.A. Stern, Can. J. Chem. 55, 1968 (1977). 10.1139/v77-274
30. I. -K. Jeong, R. H. Heffner, M. J. Graf, and S. J. L. Billinge. Phys. Rev. B 67, 104301 (2003). 10.1103/PhysRevB.67.104301
31. P. A. Lee and G. Beni, Phys. Rev. B 15, 2862 (1977). 10.1103/PhysRevB.15. 2862
32. A. P. Hitchcock and A. P. Teng. Surf. Sci. 149, 558 (1985). 10.1016/0039-6028(85)90081-0
33. O. V. Anoshina, V. Y. Bodryakov, A. A. Povzner, and I. V. Safonov. Russ. Phys. J. 48, 1235 (2005). 10.1007/s11182-006-0053-5 (Pubitemid 43965560)
34. P. Fornasini, S. A. Beccara, G. Dalba, R. Grisenti, A. Sanson, M. Vaccari, and F. Rocca. Phys. Rev. B 70, 174301 (2004). 10.1103/PhysRevB.70. 174301 (Pubitemid 40116139)
35. E. A. Stern, C. E. Bouldin, B. V. Roedern, and J. Azoulay. Phys. Rev. B 27, 6557 (1983). 10.1103/PhysRevB.27.6557
36. G. Jacobs and I. Egry. Phys. Rev. B 59, 3961 (1999). 10.1103/PhysRevB.59. 3961
37. F. C. Frank. Proc. Roy. Soc. Lond. A 215, 43 (1952). 10.1098/rspa.1952. 0194
38. H. Reichert, O. Klein, H. Dosch, M. Denk, V. Honkimki, T. Lippmann, and G. Reiter. Nature 408, 839 (2000). 10.1038/35048537 (Pubitemid 32016090)
39. A. Di Cicco, A. Trapananti, and S. Faggioni. Phys. Rev. Lett. 91, 135505 (2003). 10.1103/PhysRevLett.91.135505
40. L. Hui and F. Pederiva, J. Chem. Phys. 118, 10707 (2003). 10.1063/1.1574771
41. K. F. Kelton, G. W. Lee, A. K. Gangopadhyay, R. W. Hyers, T. J. Rathz, J. R. Rogers, M. B. Robinson, and D. S. Robinson. Phys. Rev. Lett. 90, 195504 (2003). 10.1103/PhysRevLett.90.195504
42. A. Hirata, P. Guan, T. Fujita, Y. Hirotsu, A. Inoue, A. R. Yavari, T. Sakurai, and M. Chen. Nat. Mater. 10, 28 (2011). 10.1038/nmat2897