In situ EFTEM/PEELS investigation of melting behavior of individual Al-Si alloy small particles

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 350-351

  Oleshko, Vladimir P ^a   Howe, James M ^a  

^a University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544229243     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604884447     Document Type: Conference Paper

References (6)

1. V. P. Oleshko et al., J. Electron Microsc. 51 (2002) (Suppl.), S27.
2. J. L. Murray, A. J. McAlister, Bull. Alloy Phase Diagrams 5 (1984) 74.
3. G. A. Storaska, J. M. Howe, Mater. Sci. Eng. A, (2004) in press.
4. S. Tsukimoto et al., J. Microsc. 203 (2001) 17.
5. R. Smith et al., Handbook of Optical Constants of Solids, Academic Press, London, 1998, 369.
6. The research was supported by the Division of Materials Science & Engineering, Office of Science, US Department of Energy (Grant No. DE-FG02-01ER45918). The authors are grateful to Mr. T. Yokota (JFE Steel Corp., Japan) for his help in this research.