Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

Advances in Imaging and Electron Physics

Volumn 153, Issue , 2008, Pages 283-325

  Kirkland, Angus I ^a   Nellist, Peter D ^a   Chang, Lan Yun ^a   Haigh, Sarah J ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION MEASUREMENT; ABERRATION-CORRECTED; BEAM-LIMITING APERTURES; CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPIES; HIGHER ORDER ABERRATIONS; ILLUMINATION ANGLE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPHERICAL ABERRATIONS;

ABERRATIONS;

EID: 67649405008     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(08)01008-2     Document Type: Chapter

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