Direct atomic-scale imaging of hydrogen and oxygen interstitials in pure niobium using atom-probe tomography and aberration-corrected scanning transmission electron microscopy

ACS Nano

Volumn 7, Issue 1, 2013, Pages 732-739

  Kim, Yoon Jun ^a   Tao, Runzhe ^b   Klie, Robert F ^b   Seidman, David N ^a,c  

^a Northwestern University   (United States)

^b UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^c NORTHWESTERN UNIVERSITY   (United States)

Author keywords

aberration corrected STEM; annular bright field images; atom probe tomography; Nb; Nb oxides; NbH

Indexed keywords

ABERRATION-CORRECTED STEM; ATOM PROBE TOMOGRAPHY; BRIGHT-FIELD IMAGES; NB OXIDES; NBH;

ATOMS; ELECTRON ENERGY LOSS SPECTROSCOPY; HYDROGEN; NIOBIUM; OXYGEN; PROBES; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET LASERS;

NIOBIUM OXIDE;

HYDROGEN; NANOMATERIAL; NIOBIUM; OXYGEN;

ARTICLE; ARTIFACT; ATOMIC FORCE MICROSCOPY; CHEMISTRY; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; ULTRASTRUCTURE;

ARTIFACTS; HYDROGEN; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; NANOSTRUCTURES; NIOBIUM; OXYGEN; PARTICLE SIZE;

MLCS; MLOWN;

EID: 84872869244     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn305029b     Document Type: Article

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