The use of plasmon spectroscopy and imaging in a transmission electron microscope to probe physical properties at the nanoscale

Journal of Nanoscience and Nanotechnology

Volumn 12, Issue 11, 2012, Pages 8580-8588

  Oleshko, Vladimir P ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

AEM (EELS; EFTEM); High resolution TEM; In situ; Nanoscale phenomena; Plasmons

Indexed keywords

ANALYTICAL EXPRESSIONS; COHESIVE ENERGIES; DYNAMIC TRANSFORMATION; EFTEM); ELASTIC PROPERTIES; ENERGY FILTERING; HIGH-RESOLUTION TEM; MATERIAL RESEARCH; NANO SCALE; NANO-SCALE MATERIALS; NANOPRECIPITATES; OPTICAL RESPONSE; QUANTITATIVE DETERMINATIONS; REAL-TIME INFORMATION; SPECTROSCOPIC IMAGING TECHNIQUES; STRUCTURAL ALLOYS; TRANSMISSION ELECTRON MICROSCOPE; VALENCE EELS; VALENCE-ELECTRON STATE; VOLUME PLASMON;

DIESEL ENGINES; ELECTRON BEAMS; ENERGY DISSIPATION; HARDNESS; MATERIALS PROPERTIES; NANOTECHNOLOGY; PHYSICAL PROPERTIES; PLASMONS; PRECIPITATION (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY;

NANOSTRUCTURED MATERIALS;

NANOMATERIAL;

ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; MATERIALS TESTING; METHODOLOGY; SURFACE PLASMON RESONANCE; TRANSMISSION ELECTRON MICROSCOPY; ULTRASTRUCTURE;

COMPUTER SIMULATION; MATERIALS TESTING; MICROSCOPY, ELECTRON, TRANSMISSION; MODELS, CHEMICAL; MODELS, MOLECULAR; NANOSTRUCTURES; SURFACE PLASMON RESONANCE;

MLCS; MLOWN;

EID: 84871899776     PISSN: 15334880     EISSN: 15334899     Source Type: Journal    
DOI: 10.1166/jnn.2012.6818     Document Type: Article

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