Tomographic nanofabrication of ultrasharp three-dimensional nanostructures

Applied Physics Letters

Volumn 93, Issue 15, 2008, Pages

  Saghi, Zineb ^a   Gnanavel, Thirunavukkarasu ^a   Peng, Yong ^a   Inkson, Beverley J ^a   Cullis, Anthony G ^a   Gibbs, Mike R ^a   Möbus, Günter ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIAGNOSTIC RADIOGRAPHY; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRON BEAMS; MEDICAL IMAGING; MICROSCOPIC EXAMINATION; SCANNING; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; TWO DIMENSIONAL;

ATOM PROBES; CHARACTERIZATION TECHNIQUES; ELECTRON TOMOGRAPHIES; FOCUSED ELECTRON BEAMS; HOLLOW STRUCTURES; MAGNETOCONDUCTANCE; MULTIPLE SAMPLES; NANOBRIDGES; NANOFABRICATION; NANOFABRICATION TECHNIQUES; PATTERNING TECHNIQUES; SCANNING PROBES; SCANNING TRANSMISSION ELECTRON MICROSCOPES; STANDARD METHODS; TIP RADIUSES; TOMOGRAPHIC; ULTRAFINE;

THREE DIMENSIONAL;

EID: 54149102311     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2998360     Document Type: Article

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