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Volumn 8, Issue 4, 2002, Pages 350-364

Use of plasmon spectroscopy to evaluate the mechanical properties of materials at the nanoscale

(3) Oleshko, Vladimir P a Murayama, Mitsuhiro a Howe, James M a

a University of Virginia (United States)

Author keywords

Bulk modulus; Mechanical properties; Microhardness; Nanostructures; Parallel electron energy loss spectroscopy (PEELS); Shear modulus; Volume plasmons; Young's modulus

Indexed keywords

ALLOY; ALUMINUM; COPPER; METAL;

CONFERENCE PAPER; MECHANICS; METHODOLOGY; NANOTECHNOLOGY; SPECTROSCOPY;

ALLOYS; ALUMINUM; COPPER; MECHANICS; METALS; NANOTECHNOLOGY; SPECTRUM ANALYSIS;

EID: 0036692365 PISSN: 14319276 EISSN: None Source Type: Journal
DOI: 10.1017/s1431927602020299 Document Type: Conference Paper

Times cited : (37)

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