HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques

Journal of Physics: Conference Series

Volumn 241, Issue , 2010, Pages

  Koh, Ai Leen ^a   Tomanec, Ondřej ^b   Urbánek, Michal ^b   Šikola, Tomáš ^b   Maier, Stefan A ^a   McComb, David W ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; ELECTRON SCATTERING; ENERGY DISSIPATION; FOCUSED ION BEAMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOANTENNAS; PLASMONS; SURFACE PLASMON RESONANCE;

FOCUSED ION BEAM TECHNIQUE; LOCALIZED SURFACE PLASMON RESONANCE; NANO-ANTENNA STRUCTURES; PATTERNED FILMS; PLASMONICS;

ION BEAMS;

EID: 78651101415     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/241/1/012041     Document Type: Conference Paper

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