Near-field scanning optical microscopy nanoprobes

Nanotechnology Reviews

Volumn 1, Issue 4, 2012, Pages 313-338

  Fleischer, Monika ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

Nano optics; Nanofabrication; Near field scanning optical microscopy; Scanning probe microscopy; Tip enhanced Raman spectroscopy

Indexed keywords

DIFFRACTION; ELECTROMAGNETIC FIELDS; IMAGE ENHANCEMENT; LIGHT SOURCES; NANOTECHNOLOGY; OPTICAL DATA STORAGE; RAMAN SPECTROSCOPY; SCANNING PROBE MICROSCOPY;

DIFFRACTION LIMITS; EXTERNAL ELECTROMAGNETIC FIELD; NANO OPTICS; NANO-METER SCALE; OPTICAL IMAGING; POINT LIGHT SOURCE; SUBWAVELENGTH APERTURES; TIP-ENHANCED RAMAN SPECTROSCOPY;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 84874968472     PISSN: 21919089     EISSN: 21919097     Source Type: Journal    
DOI: 10.1515/ntrev-2012-0027     Document Type: Review

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