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Volumn 161, Issue 1-3, 1999, Pages 156-162
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Electromagnetic field enhancement in the context of apertureless near-field microscopy
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Author keywords
Field enhancement; Scanning near field microscopy; Surface plasmons
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Indexed keywords
LIGHT SCATTERING;
SURFACE ROUGHNESS;
ELECTROMAGNETIC FIELD ENHANCEMENT;
SCANNING NEAR-FIELD MICROSCOPY;
OPTICAL MICROSCOPY;
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EID: 0033100811
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/S0030-4018(98)00682-8 Document Type: Article |
Times cited : (88)
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References (26)
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