Invited Review Article: A review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements

Review of Scientific Instruments

Volumn 78, Issue 8, 2007, Pages

  Gan, Yang ^a,b  

^a UNIVERSITY OF NEWCASTLE   (Australia)

^b UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MEASUREMENT THEORY; OPTICAL MICROSCOPY;

MODIFICATION TECHNIQUES; NEAR-FIELD OPTICAL MEASUREMENTS; SURFACE FORCE MEASUREMENTS;

NANOPARTICLES;

MICROSPHERE; NANOPARTICLE;

ADSORPTION; CHEMISTRY; GENETIC PROCEDURES; INSTRUMENTATION; MATERIALS TESTING; MECHANICAL STRESS; METHODOLOGY; OPTICS; REVIEW; SCANNING PROBE MICROSCOPY; SURFACE PROPERTY; ULTRASTRUCTURE;

ADSORPTION; MATERIALS TESTING; MICROSCOPY, SCANNING PROBE; MICROSPHERES; MOLECULAR PROBE TECHNIQUES; NANOPARTICLES; OPTICS; STRESS, MECHANICAL; SURFACE PROPERTIES;

EID: 34548430600     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2754076     Document Type: Article

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