Two particle enhanced nano raman microscopy and spectroscopy

Nano Letters

Volumn 7, Issue 6, 2007, Pages 1736-1740

  Olk, Phillip ^a   Renger, Jan ^a   Härtling, Thomas ^a   Wenzel, Marc Tobias ^a   Eng, Lukas M ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; OPTICAL FIBERS; POLARIZATION; RAMAN SCATTERING; RAMAN SPECTROSCOPY; THREE DIMENSIONAL;

ELECTRIC FIELD PROBER; NEAR-FIELD COUPLING; RAMAN MICROSCOPY; RAMAN SIGNATURES;

NANOPARTICLES;

NANOMATERIAL;

ARTICLE; CHEMISTRY; IMAGE ENHANCEMENT; METHODOLOGY; MICROSCOPY; NANOTECHNOLOGY; PARTICLE SIZE; RAMAN SPECTROMETRY; SENSITIVITY AND SPECIFICITY; ULTRASTRUCTURE;

IMAGE ENHANCEMENT; MICROSCOPY; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SENSITIVITY AND SPECIFICITY; SPECTRUM ANALYSIS, RAMAN;

EID: 34547349859     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl070727m     Document Type: Article

References (36)

1. Novotny, L.; Hecht, B. Principles of Nano-Optics; Cambridge Unversity Press: Cambridge, New York, 2006.
2. Lal, S.; Grady, N. K.; Goodrich, G. P.; Halas, N. J. Nano Lett. 2006, 6, 2338.
3. Kühn, S.; Håkanson, U.; Rogobete, L.; Sandoghdar, V. Phys. Rev. Leu. 2006, 97, 017402.
4. Domke, K. F.; Zhang, D.; Pettinger, B. J. Am. Chem. Soc. 2006, 128, 14721.
5. Kalkbrenner, T.; Ramstein, M.; Mlynek, J.; Sandoghdar, V. J. Microsc. 2001 202-1, 72.
6. Schneider, S. C.; Grafström, S.; Eng, L. M. Phys. Rev. B 2005, 71, 115418.
7. Stöckle, R.; Suh, Y.; Deckert, V.; Zenobi, R. Chem. Phys. Lett. 2000, 318, 131.
8. Demming, A. L.; Festy, F.; Richards, D. J. Chem. Phys. 2005, 122, 184716.
9. Bouhelier, A.; Renger, J.; Beversluis, M.; Novotny, L. J. Microsc. 2003, 210-3, 220.
10. Kottmann, J.; Martin, O. Opt. Expr. 2001, 8, 655.
11. Blanco, L. A.; García de Abajo, F. J. Phys. Rev. B 2004, 69, 205414.
12. ten Bloemendal, D.; Ghenuche, P.; Quidant, R.; Cormack, I. G.; Loza-Alvarez, P.; Badenes, G. Plasmonics 2006, 1, 41.
13. Dahmen, C.; Schmidt, B.; von Plessen, G. Nano Lett. 2007, 7, 318.
14. Su, K.-H.; Wei, Q.-H.; Zhang, X.; Mock, J. J.; Smith, D. R.; Schultz, S. Nano Lett. 2003, 3, 1087.
15. Sönnichsen, C. Plasmons in metal nanostructures; Cuviller Verlag: Göttingen, 2001.
16. Bosbach, J.; Hendrich, C.; Stietz, F.; Vartanyan, T.; Träger, F. Phys. Rev. Lett. 2002, 89, 257404.
17. Renger, J.; Grafström, S.; Eng, L. M.; Decken, V. J. Opt. Soc. Am. A 2004, 21, 1362.
18. Renger, J. Excitation, Interaction, and Scattering of Localized and Propagating Surface Polaritons. Ph.D. Thesis, TU Dresden, 2006.
19. Jiang, J.; Bosnick, K.; Maillard, M.; Brus, L. J. Phys. Chem. B 2003, 107, 9964.
20. Svedberg, F.; Li, Z.; Xu, H.; Käll, M. Nano Lett. 2006, 6, 2639.
21. Bergman, D. J.; Stockman, M. I. Phys. Rev. Lett. 2003, 90, 027402.
22. Seidel, J.; Grafström, J.; Eng, L. M. Phys. Rev. Lett. 2005, 94, 177401.
23. Li, K.; Stockman, M. I.; Bergman, D. J. Phys. Rev. Lett. 2003, 91, 227402.
24. Karrai, K.; Grober, R. D. Appl. Phys. Lett. 1995, 66, 1842.
25. Bryant, M. A.; Pemberton, J. E. J. Am. Chem. Soc. 1991, 113, 8284.
26. Kudelski, A. J. Raman Spectrosc. 2003, 11, 853.
27. Levin, C. S.; Janesko, B. G.; Bardhan, R.; Scuseria, G. E.; Hartgerink, J. D.; Halas, N. J. Nano Lett. 2006, 6, 2617.
28. Schmidt, J. U.; Bergander, H.; Eng, L. M. J. Appl. Phys. 2000, 87, 3108.
29. Hafner, C. The Generalized Multipole Technique for Computational Electromagnetics; Artech House: Norwood, MA, 1990.
30. Hafner, C.; Bomholt, L. The 3D Electrodynamic Wave Simulator. Wiley: Chichester, U.K., 1993.
31. Hafner, C. Post-Modem Electromagnetics, Using Intelligent MaXwell Solvers; Wiley: Chichester, U.K., 1999.
32. Camillone, N.; Chidsey, C. E. D.; Liu, G.; Putvinski, T. M.; Scoles, G. J. Chem. Phys. 1991, 94, 8493.
33. Novotny, L.; Grober, R. D.; Karrai, K. Opt. Lett. 2001, 26, 789.
34. Pandey, P.; Singh, S. P.; Arya, S. K.; Gupta, V.; Datta, M.; Singh, S.; Malhotra, B. D. Langmuir 2007, 23, 3333.
35. Govorov, A. O.; Carmeli, I. Nano Lett. 2007, 7, 620.
36. Härtling, T.; Eng, L. M. Appl. Phys. Lett. 2005, 87, 142902.