Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes

Applied Physics Letters

Volumn 77, Issue 23, 2000, Pages 3695-3697

  Eckert, Rolf ^a,c   Freyland, J Moritz ^c   Gersen, Henkjan ^b,c   Heinzelmann, Harry ^c   Schürmann, Gregor ^d   Noell, Wilfried ^d   Staufer, Urs ^d   De Rooij, Nico F ^d  

^a UNIVERSITY OF BASEL   (Switzerland)

^b UNIVERSITY OF TWENTE   (Netherlands)

^c CSEM   (Switzerland)

^d UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012388416     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1330571     Document Type: Article

References (13)

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