Fabrication of cone-shaped boron doped diamond and gold nanoelectrodes for AFM-SECM

Nanotechnology

Volumn 22, Issue 14, 2011, Pages

  Avdic, A ^a   Lugstein, A ^a   Wu, M ^b   Gollas, B ^b,c   Pobelov, I ^d   Wandlowski, T ^d   Leonhardt, K ^e   Denuault, G ^e   Bertagnolli, E ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b CEST Centre of Electrochemical Surface Technology   (Austria)

^c GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^d UNIVERSITY OF BERN   (Switzerland)

^e UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM PROBE; AFM TIP; BORON DOPED DIAMOND; FOCUSED ION BEAM MACHINING; FORMATION PROCESS; GOLD NANOELECTRODES; MEASUREMENT TOOLS; MICROFABRICATION PROCESS; NANOSCALED; SCANNING ELECTROCHEMICAL MICROSCOPY; SEMICONDUCTOR PROCESSING TECHNIQUES;

ATOMIC FORCE MICROSCOPY; BORON; CYCLIC VOLTAMMETRY; ELECTRODES; FABRICATION; REACTIVE ION ETCHING; SCANNING ELECTRON MICROSCOPY; SENSORS;

ANALYTIC EQUIPMENT;

BORON; CHROMIUM; DIAMOND; GOLD; SILICON; SILICON DERIVATIVE; SILICON NITRIDE; TITANIUM;

ALGORITHM; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTROCHEMICAL ANALYSIS; ELECTROCHEMISTRY; INSTRUMENTATION; METHODOLOGY; MICROELECTRODE; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SPECTROMETRY;

ALGORITHMS; BORON; CHROMIUM; DIAMOND; ELECTROCHEMICAL TECHNIQUES; ELECTROCHEMISTRY; GOLD; MICROELECTRODES; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; MICROSCOPY, SCANNING PROBE; NANOTECHNOLOGY; SILICON; SILICON COMPOUNDS; SPECTROMETRY, X-RAY EMISSION; TITANIUM;

EID: 79952675784     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/14/145306     Document Type: Article

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