Field-enhanced scanning near-field optical microscopy

Microscopy Research and Technique

Volumn 69, Issue 7, 2006, Pages 563-579

  Bouhelier, Alexandre ^a,b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITÉ DE BOURGOGNE   (France)

Author keywords

Electromagnetic enhancement; Multiphoton microscopy; Optical resolution; Raman microscopy; Surface plasmons

Indexed keywords

ELECTRIC EXCITATION; ELECTROMAGNETIC FIELDS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DATA STORAGE;

ELECTROMAGNETIC ENHANCEMENT; FIELD ENHANCEMENT; INDUCED FIELD; MULTIPHOTON MICROSCOPY; OPTICAL RESOLUTION; RAMAN MICROSCOPY; SCANNING MICROSCOPE; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SURFACE-PLASMON; TIP-INDUCED;

SURFACE PLASMONS;

CONTRAST ENHANCEMENT; ELECTROMAGNETIC FIELD; NANOTECHNOLOGY; PRIORITY JOURNAL; RAMAN SPECTROMETRY; REVIEW; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SEMICONDUCTOR; SURFACE PLASMON RESONANCE; SURFACE PROPERTY; TECHNIQUE;

EID: 33746135216     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20328     Document Type: Review

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