Moulded photoplastic probes for near-field optical applications

Journal of Microscopy

Volumn 202, Issue 1, 2001, Pages 16-21

  Kim, B J ^a   Flamma, J W ^a   Ten Have, E S ^a   Garcia Parajo, M F ^a   Van Hulst, N F ^a   Brugger, J ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Dry lift off; Microfabrication; Near field optical probes; Self assembled monolayer; SU 8

Indexed keywords

COATINGS; ION BEAMS; MICROANALYSIS; MICROFABRICATION; MOLDS; OPTICAL FIBER FABRICATION; OPTICAL FIBERS; POTASSIUM HYDROXIDE; SELF ASSEMBLED MONOLAYERS; SILICON WAFERS;

DRY LIFT OFF; HIGH QUALITY; INTENSITY LOSS; MICRO-FABRICATION; NEAR FIELDS; NEAR-FIELD OPTICAL PROBES; OPTICAL APPLICATIONS; SU-8; TAPERED OPTICAL FIBERS; TRANSMITTED LIGHT;

PROBES;

GLASS FIBER; POLYMER; SILICON;

ANISOTROPY; ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; FIBER; LIGHT; OPTICS; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; TOPOGRAPHY;

EID: 0035059156     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00820.x     Document Type: Conference Paper

References (14)

1. Micromachined aperture probe tip for multifunctional scanning probe microscopy
2. Low-temperature thermaloxidation sharpening of microcast tips
3. Terahertz time-domain spectroscopy of films fabricated from SU-8
4. Nanostructured probes for scanning near-field optical microscopy
5. Soft, entirely photoplastic probes for scanning force microscopy
6. Near-field spectroscopy of the quantum constituents of a luminescent system
7. Comparison of mechanically drawn and protection layer chemically etched optical fiber tips
8. 'SAMs meet MEMS' - A monolayer assisted surface microfabriction and release technique
9. Cantilever probes for SNOM applications with single and double aperture tips
10. Optical sthetoscopy: Image recording with resolution 1/20
11. Dynamic behavior of tuning fork shear force feedback
12. Organized monolayers by adsorption. 1. Formation and structure of oleophobic mixed monolayers on solid surfaces
13. High-quality near-field eptical probes by tube etching
14. High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling